FOREWORD

APPLICATION • The S-3400N SEM utilizes an electron beam accelerated at 300V to 30kV. The instrument is designed mainly for observation and evaluation of specimens prepared for the SEM.

•Note that Hitachi Science Systems, Ltd. will not be responsible for injury or damage caused by usage of the instrument in a manner not described in this manual.

CAUTION

The electron microscope need not conform to the “Radiation Hazard

 

Preventive Laws” or “Ionizing Radiation Hazard Preventive Regulations”

 

currently in effect throughout the world, unlike the instruments designed to

 

produce X-rays.

 

The suggestion made by the ICRP (International Committee on Radiation

 

Hazard Prevention), however, clearly defines that the electron

 

microscope, like the home television set, will potentially produce a certain

 

amount of X-rays as an undesirable byproduct. From a safety viewpoint,

 

therefore, it is essential to operate the instrument carefully taking into

 

account the following fundamental precautions.

 

(1) Use the instrument within the application range specified in the

 

catalog or instruction manual.

 

(2) Do not operate the instrument with covers or doors removed, nor use

 

alternatives for these components.

 

(3) Do not apply modifications which may possibly result in deactivation

 

of the built-in safety devices.

FOREWORD - 1