360050398

10.8.42.6.5.4 Current span under test

The Current span under test field shall be written with a value of zero by the host. As the self-test progresses, the device shall modify this value to contain the test span number of the current span being tested. If an off-line scan between test spans is selected, a value greater then five is placed in this field during the off-line scan. When the self-test including the off-line scan between test spans has been completed, a zero value is placed in this field.

10.8.42.6.5.5 Feature flags

The Feature flags define the features of Selective self-test to be executed (see following table).

 

Selective self-test feature flags
Bit

Description

0

Vendor specific

1

When set to one, perform off-line scan after selective test.

2

Vendor specific

3

When set to one, off-line scan after selective test is pending.

4

When set to one, off-line scan after selective test is active.

5-15

Reserved.

Bit (1) shall be written by the host and returned unmodified by the device. Bits (4:3) shall be written as zeros by the host and the device shall modify them as the test progresses.

10.8.42.6.5.6 Selective self-test pending time

The selective self-test pending time is the time in minutes from power-on to the resumption of the off-line testing if the pending bit is set. At the expiration of this time, sets the active bit to one, and resumes the off-line scan that had begun before power-down.

10.8.42.6.5.7 Data structure checksum

The data structure checksum is the two's complement of the sum of the first 511 bytes in the data structure. Each byte will be added with unsigned arithmetic, and overflow will be ignored. The sum of all 512 bytes is zero when the checksum is correct. The checksum is placed in byte 511.

Toshiba Corporation Digital Media Network Company

Page 120 of 157

© 2005, Copyright TOSHIBA Corporation All Rights Reserved