•50 kHz to 26.5 GHz with expand carrier frequencies to 110 GHz

•Quick and easy integration into your ATE system

E5503A

E5500 Series Phase Noise Measurement Solutions

The new Agilent E5500 A-series phase noise measurement solutions have been designed to minimize production ATE test times for one- port VCOs, DROs, crystal oscillators, and synthesizers and to maxi- mize the capability for R&D benchtop applications. In addition, with a standard offset range capability from 0.01 Hz to 100 MHz, the E5500 B-series provides the capability, flexibility, and versatility to meet changing and demanding needs placed upon the R&D engineer. By building upon 30 years of Agilent low phase noise, RF design and measurement experience, the E5500 series solutions continue to provide excellent measurement integrity, repeatability, and accuracy.

The E5500 phase noise measurement solutions use the power of a flexible software program to automate phase noise carrier mea- surements. The E5500 A-series solutions include the 70420A phase noise test set, which contains phase detectors and phase-lock loop circuitry, a high speed VXI digitizer with mainframe and high speed VXI-to-PC interface for base-band signal analysis, selected low-noise frequency downconverters, and measurement software. When com- bined with a PC running Windows NT 4.0, this series provides fast phase noise measurements of carrier frequencies from 50 kHz to 1.6 GHz, 6.0 GHz, 18 GHz, or 26.5 GHz over offset-from-carrier frequen- cies of 0.01 Hz to 4 MHz.1 The E5500 B-series includes the 70420A phase noise test set, a Pentium PC running Windows NT 4.0, a PC dig- itizer, and an RF spectrum analyzer, selected low-noise frequency downconverters, and measurement software. This series of solutions provides phase noise measurements of carrier frequencies from 50 kHz to 1.6 GHz, 6.0 GHz, 18 GHz, or 26.5 GHz over offset-from-carrier frequencies from 0.01 Hz to 100 MHz. A variety of signal generators— such as the 8662A, 8663A, 8643A, 8644B, 8664A/B, 8665A—can also be added to provide a low-noise reference signal.

Phase Noise Measurement Software

A graphical user interface provides measurement menus allowing the operator to specify the measurement process, including the cali- bration of the system. Several output formats are available to the user, including plots of the single-sideband phase noise power of the signal, integrated noise power, or the calculated Allan variance. A real-time measure-ment mode is available to monitor the level of phase noise and discrete spurs as changes are made to the device- under-test. The E5500 series phase noise measurement software requires a Pentium PC with 32 MBytes of RAM, a 1 GByte hard drive, and Windows NT 4.0.

1It can be extended to cover offset ranges up to 100 MHZ.

Phase Noise Measuring Systems

Phase Noise Measurement Solutions

•Ability to test a wide range of devices

•Measure AM noise directly

E5503B

Specifications

E5500 A-Series

E5500 B-Series

E5501A: 50 kHz to 1.6 GHz

E5501B: 50 kHz to 1.6 GHz

E5503A: 50 kHz to 18.0 GHz

E5502B: 50 kHz to 6.0 GHz

E5504A: 50 kHz to 26.5 GHz

E5503B: 50 kHz to 18.0 GHz

 

E5504B: 50 kHz to 26.5 GHz

Operating Characteristics

Offset Frequency Range

A Models: 0.01 Hz to 4 MHz

B Models: 0.01 Hz to 100 MHz

System Noise Response 2: –180 dBc/Hz typically (>10 kHz offsets)

System Spurious Response 2: –120 dBc typically

Phase Detector Input Power: (<1.6 GHz carrier frequency) R input = 0 to +23 dBm

L input = +15 to +23 dBm Downconverter Input Range: 1 GHz to 6 GHz; 1 GHz to 18 GHz; 1.5 GHz to 26.5 GHz External Noise Input Port: 0.1 Hz to 100 MHz Measurement Accuracy: ±2 dB (<1.0 MHz offsets); ±4 dB (<100 MHz offsets)

E5500 A-Series Optional Capabilities

Extend offset range to 8, 10, and 100 MHz Add RF reference source

Add high power input capability (includes µW phase and AM detectors)

Extend carrier frequency to 110 GHz

E5500 B-Series Optional Capabilities

Add RF reference source

Add high power input capability (includes µW phase and AM detectors)

Add remote SCPI programming client Extend carrier frequency to 110 GHz

2Without reference sources or downconverters

Key Literature

E5500 Series Phase Noise Measurement Solutions,

Product Overview, p/n 5965-7590E

E5500 Series Phase Noise Measurement Solutions

Configuration Guide, p/n 5965-7589E

Ordering Information

E5500A Series

E5500B Series

See configuration guide for detailed ordering information.

341

E5500 Series

6

Internet URL www.agilent.com/find/tmc

Product & Order Info See page 604

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Agilent Technologies E5503A specifications E5500 Series Phase Noise Measurement Solutions, Specifications, Key Literature
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E5503A, E5500 B-series, E5500 Series specifications

Agilent Technologies, a leader in electronic design automation, offers a comprehensive range of test and measurement equipment with its E5500 Series, including the E5500 B-series and E5503A. These systems are designed to meet the rigorous demands of high-speed digital design and analysis, providing engineers and designers with the tools needed for effective debugging, validation, and performance analysis.

The E5500 Series is recognized for its versatility, supporting a wide array of applications across different industries such as telecommunications, aerospace, and semiconductor testing. At the heart of these systems is advanced signal analysis technology that delivers unparalleled accuracy and performance. The E5500 family is distinguished by its ability to handle multi-gigabit data rates, making it ideal for modern digital designs that require precise measurements of fast signals.

One of the key features of the E5500 Series is its modular architecture, allowing users to customize their systems according to specific testing needs. This flexibility enables the integration of various modules tailored for different applications, fostering an efficient workflow. Additionally, the E5500 B-series enhances the original E5500 platform with improved performance specifications, further optimizing signal integrity and measurement precision.

The E5503A variant stands out with its exceptional capabilities for both time-domain and frequency-domain measurements. Equipped with advanced time interval analyzers, the E5503A enables high-resolution jitter analysis and time-based measurements essential for diagnosing signal integrity issues in high-speed digital designs. Its superior analysis tools facilitate thorough characterization, essential for ensuring compliance with stringent industry standards.

Another important characteristic of the E5500 Series is its user-friendly interface, which simplifies the operation of complex tasks. The intuitive software integrates seamlessly with the hardware, allowing users to visualize data, generate reports, and share findings efficiently. This ease of use empowers engineers to rapidly iterate designs and optimize performance.

In addition to its technical specifications, Agilent Technologies places a strong emphasis on reliability and support. The E5500 Series is backed by comprehensive customer service and technical assistance, ensuring that users receive the guidance they need to maximize the capabilities of their systems.

In conclusion, the Agilent E5500 Series, including the E5500 B-series and E5503A, exemplifies cutting-edge technology in test and measurement solutions. With its modular design, advanced analysis capabilities, and user-friendly interface, it serves as an indispensable tool for engineers striving to excel in high-speed digital design and testing. Whether for debug or validation, these systems provide the precision and performance that modern applications demand.
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