WITE32 Release Notes Version 3.11
The following is an example of the Band Erase dialog box, which opens after you press the Erase Setup… button in
the test configuration dialog box:
The caption shows which test erase
operation configuration is being edited
Selects between using a System Erase
configuration or Custom Erase configuration
Figure 8 Low Erase Current Test Band Erase Configuration in WITE32 version 3.11
2.1.5 Tests With Erase Preconditioning A new System Erase option is added to preconditioning selection of WITE32 tests. When this option is selected, the
System Erase configuration will be used for preconditioning. The following is the list of the tests, which include this
new preconditioning option:
• Digital Parametric Tests module: Digital Parametric test.
• Error Tests module: Comparator Error test.
• MR Tests module: Pulse Stability, Pulse Width Asymmetry, and TAA Asymmetry tests.
• Parametric Tests module: Asymmetry, TAA, and Pulse Width tests.
• PRML Tests module: Sequenced Amplitude Margin and Sampled Value Distribution tests.
• Composite Tests module: Triple Track Profile and Pulse Profile tests.
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