10.Hit ENTER to move $ sign against STIG ALIGN Y Press ENTER again
11.The image will oscillate on the screen, minimise oscillation with ALIGNMENT X and Y knobs.
12.Press PF16 EXIT to finish.
G.CHANGING THE DETECTOR
The 4500 has two secondary electron detectors, an upper detector which sits above the specimen and a lower detector which sits to the side of the specimen. Each detector provides a different perspective of the specimen. To change the detector:
1.Press PF2 COLUMN COND 1.
2.Using up/down arrowed keys on keyboard move cursor $ down to line 8. This will tell you which detector is currenfly in use, e.g. 'Upper'.
3.Press left/right arrowed keys on keyboard. Below the menu the INPUT detector, i.e. the one to be chosen will be displayed. In this case 'Lower.
4.Press ENTER and the detector displayed at INPUT will become active.
5.Press PF16 EXIT to finish.
6.Changing detectors may require you refocus the image and adjust brightness and contrast.
7.n.b. The upper detector generally works better at short working distances <18. The lower detector generally works better at long working distances >18. See figure below. You may accordingly need to change the specimen height.
H. CHANGING THE WORKING DISTANCE
1.The working distance is changed by using the Z adjust on the specimen chamber. The approximate working distance can be read directly from this control.
2.Changing the working distance will defocus the image. Focus can be obtained using the COARSE and FINE focus controls.
3.Coarse focus can be readjusted by pressing PF2 COLUMN COND 1.
4.Using up/down arrowed keys on keyboard move cursor
5.Enter desired working distance using numeric keyboard keys e.g. 20.
6.Press ENTER
7.Microscope will automatically go to a working distance of 20.
8. Press PF16 EXIT to clear screen.
