Philips Semiconductors Product specification
SA5223Wide dynamic range AGC transimpedance amplifier(150MHz)
1995 Oct 24 4
TEST CIRCUITS
Test Circuit 1: Bandwidth
NETWORK ANALYZER
S-PARAMETER TEST SET
PORT1 PORT2
VCC .1uF
.1uF
50
ZO = 50Ω
OUT
OUT
IN DUT
0.1uF
R=1k
50 GND1
SINGLE-ENDED
GND2
RTSE +12.4 @S21 @RIN,R
IN +1k )RINSS [1250W
ZO = 50Ω
SD00370
500
500
Test Circuit 2: Noise
SPECTRUM ANALYZER
VCC
OUT
OUT
IN DUT
GND2
GND1
NE5209
50Ω
.1µF
.1µF
1.0µF
1.0µF
CS
50Ω
SD00371
NETWORK ANALYZER
S-PARAMETER TEST SET
PORT1 PORT2
VCC .1uF
.1uF
OUT
OUT
IN DUT
GND2
GND1
50Ω
CAL
UNBAL.
0.1uF
NC
50Ω
BIAS TEE
5V
NHO300HB
TRANSFORMER
CONVERSION
LOSS = 9dB
100Ω
BAL.
SD00372
Test Circuit 3: PSRR
Test Circuit 4: Duty Cycle Distortion
PULSE GEN
OUT
OUT
DUT OSCILLOSCOPE
A
B
Meaurement done using
differential wave forms
5V
0.1uF
.1µF
.1µF
GND1GND2
ZO = 50Ω
ZO = 50Ω
IN
500Ω
500Ω
1kΩ
50Ω
OFFSET
SD00373
50% DUTY CYCLE