CY62148ESL MoBL®
Switching Characteristics
Over the Operating Range [9]
Parameter
Read Cycle
Description
55 ns
Min | Max |
|
|
Unit
tRC |
| Read Cycle Time | 55 |
| ns | |||
tAA |
| Address to Data Valid |
| 55 | ns | |||
tOHA |
| Data Hold from Address Change | 10 |
| ns | |||
tACE |
|
|
|
| LOW to Data Valid |
| 55 | ns |
CE | ||||||||
tDOE |
|
|
|
| LOW to Data Valid |
| 25 | ns |
OE | ||||||||
tLZOE |
|
|
|
| LOW to Low Z [10] | 5 |
| ns |
OE | ||||||||
tHZOE |
|
|
|
| HIGH to High Z [10, 11] |
| 20 | ns |
OE | ||||||||
tLZCE |
|
|
| LOW to Low Z [10] | 10 |
| ns | |
CE | ||||||||
tHZCE |
|
|
| HIGH to High Z [10, 11] |
| 20 | ns | |
CE | ||||||||
tPU |
|
|
| LOW to Power Up | 0 |
| ns | |
CE | ||||||||
tPD |
|
|
| HIGH to Power Up |
| 55 | ns | |
CE | ||||||||
Write Cycle [12] |
|
|
|
|
|
|
|
|
tWC |
| Write Cycle Time | 55 |
| ns | |||
tSCE |
|
|
| LOW to Write End | 40 |
| ns | |
CE | ||||||||
tAW |
| Address Setup to Write End | 40 |
| ns | |||
tHA |
| Address Hold from Write End | 0 |
| ns | |||
tSA |
| Address Setup to Write Start | 0 |
| ns | |||
tPWE |
|
|
|
| Pulse Width | 40 |
| ns |
WE | ||||||||
tSD |
| Data Setup to Write End | 25 |
| ns | |||
tHD |
| Data Hold from Write End | 0 |
| ns | |||
tHZWE |
|
|
|
| LOW to High Z [10, 11] |
| 20 | ns |
WE | ||||||||
tLZWE |
|
|
|
| HIGH to Low Z [10] | 10 |
| ns |
WE |
Notes
9.Test conditions for all parameters other than
10.At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
11.tHZOE, tHZCE, and tHZWE transitions are measured when the output enter a high impedance state.
12.The internal write time of the memory is defined by the overlap of WE, CE = VIL. All signals must be ACTIVE to initiate a write and any of these signals can terminate a write by going INACTIVE. The data input setup and hold timing must be referenced to the edge of the signal that terminates the write.
Document #: | Page 6 of 10 |
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