HP 37717C manual Broadband ATM services supported configurations, ATM cell test Interfaces

Page 7

Broadband ATM services supported configurations

ATM cell test

interfaces

Option UKN1

Page 8

ATM cell generation and

analysis: 2, 34 and 140 Mb/s (includes all capability of option UKJ structured PDH).

Option UKZ2Page 8

Generation and measurement of ATM payloads: 1.544 (DS1), 44.736 (DS3), 2.048 (E1) and 34.368 (E3) Mb/s.

1ITU-T

2ANSI/ITU-T

ATM services

layer test

Option 0YK Page 9

Adds Channel View, graphical display of CDV, AAL analysis, rate history, benchmark traffic generation. Must also order option UKN or UKZ,

Option USL

Page 9

Adds Ethernet LAN

 

connectivity testing plus all features of option 0YK. Must also order option UKN or UKZ.

STM-1e test

and interfaces

Option A1T Page 8

STM-1e (155 Mb/s) electrical interface. Overhead access, thru mode and pointer sequences. TU-12, TU-2, VC-3 and VC-4 mappings. (Provides STM-1o output when option UKN and optical interface option are selected. STM-1o and OC-3c are provided when option UKZ and an optical interface option are selected).

Optical

interfaces

Option UH1

Page 10

155 Mb/s (1310 nm).

Option USN

Page 10

622/155 Mb/s (1310 and

1550 nm), optical power

measurement.

 

Option UKT

Page 10

622/155 Mb/s (1310 nm), optical power measurement.

Jitter, wander and slips

testing – generation*

Option A3K Page 9

PDH, 155 Mb/s, 622 Mb/s jitter and wander generation.

Option 140 Page 9

As option A3K but without wander generation.

Jitter, wander and slips testing – measurement*

Option UHN

Page 9

PDH jitter measurement.

Option A3L

Page 9

155 Mb/s electrical and PDH jitter measurement.

Option A3V Page 9

155 Mb/s optical, electrical and PDH jitter measurement.

Option A3N Page 9

622 Mb/s, 155 Mb/s optical, electrical and PDH jitter.

† Where specified two modules may be ordered from certain categories (ie. UH3, UHC, 0YH).

*NB Jitter generation and measurement does not include DS1, DS3 and 52 Mb/s. PDH jitter depends on options fitted. If option UKK/UKJ/UKN fitted then PDH jitter generation and measurement is provided at E1/E2/E3/E4.

If option 110 fitted then PDH jitter generation and measurement capability is provided at E1 and E3. 622 Mb/s

and 155 Mb/s jitter presented in ITU-T terminology as is specified in the HP 37717B/C communications performance analyzer technical specifications (publication number 5966-0892E).

For compliance to Bellcore standards, please contact you local Hewlett-Packard representative for details.

Please contact your local sales office if you require module interworking capability not specified here.

All modules work with UKX (printer), A3B/A3D (remote control) and USS (distributed network analyzer software).

7

Image 7
Contents Effective from February HP 37717C communications performance analyzerContents Your choice of test capability IntroductionATM services and jitter Example configurations STM-4o/STM-1o plus jitterOC-12c, DS3 structured, HP-IB Optical 3 4 5 6 7 Remote Step EightModule interworking section PDH/SDH and ATM cell layer supported configurationsSONET/SDH STM-1e test Interfaces Broadband ATM services supported configurationsATM services Layer test ATM cell test InterfacesOption Tick Code Slots One PDH/DSn and ATM test and interfaces optionsSONET/SDH test and interfaces options Wander and jitter generation optionsConnectivity tests ATM services layer test optionsPDH binary interfaces options Option Tick Code Slots OneSONET/SDH binary interfaces option Optical interfaces optionsSTM-4 test and optical interfaces Optical adaptor options Multiple PDH interfaces optionRemote-control/external-printer interfaces options Printer optionOther options and accessories
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37717C specifications

The HP 37717C is a high-performance modular test and measurement instrument designed to provide unparalleled accuracy and versatility for a wide range of applications. Targeted primarily at engineers and researchers in communications and signal processing, this instrument offers essential features and advanced technologies that cater to the evolving demands of modern testing environments.

One of the main features of the HP 37717C is its exceptional frequency coverage. With the ability to operate from a few hertz up to a staggering 2.65 GHz, it can effectively handle various signals, from low-frequency audio to high-frequency RF applications. This broad range is crucial for telecommunications testing, as it allows engineers to assess components such as amplifiers, mixers, and modulators accurately.

The HP 37717C incorporates state-of-the-art digital signal processing (DSP) technology, allowing for real-time analysis and measurements. This technology enhances the accuracy and speed of data acquisition, making it efficient for both time-sensitive applications and complex signal analyses. Furthermore, it is equipped with advanced error detection capabilities that help identify and correct signal distortions, ensuring the integrity of the data being processed.

Another standout characteristic of the HP 37717C is its modular design. This instrument can be easily integrated into larger test systems, facilitating seamless upgrades and expansions. Users can customize their setups based on specific testing needs, whether that involves adding new measurement capabilities or incorporating additional channels for multi-channel testing.

The instrument also features a user-friendly interface, complete with an intuitive graphical display that enables quick navigation through its wide array of functions and settings. This ease of use enhances productivity and reduces the learning curve for new users, allowing them to focus on their testing objectives rather than struggling with complex controls.

Moreover, the HP 37717C supports various communication protocols and standards, making it adaptable for different industries ranging from aerospace and defense to consumer electronics. Its versatile capabilities ensure that it remains relevant as technology progresses and new standards emerge.

In summary, the HP 37717C stands out in the realm of test and measurement instruments due to its strategic combination of extensive frequency range, advanced DSP technology, modular design, and user-friendly interface. These features make it an indispensable tool for engineers and researchers striving for precision in their testing endeavors.