HP 37717C ATM services layer test options, PDH binary interfaces options, Connectivity tests

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Option

No of

Tick

 

code

slots

one

4. Wander and jitter measurement options

 

 

 

 

 

 

 

 

 

 

 

Choose one option (if required). If you need PDH jitter

 

 

 

 

 

measurement then also order PDH/DSn interface option (section 1).

 

 

 

 

 

● PDH (tributary) jitter and wander measurement: 2, 8, 34, 140 Mb/s, with HP1, HP2 and

UHN

1

 

 

 

 

 

 

LP filters to ITU-T O.171 plus 2 Mb/s wander and estimated frame slip measurement.

 

 

 

 

 

 

 

 

 

 

● STM-1e line jitter and PDH (tributary) jitter; rms, peak-to-peak, auto jitter transfer

A3L

2

 

 

 

 

 

 

and wander measurement: 155 Mb/s electrical interface with HP1, HP2, LP and 12 kHz HP

 

 

 

 

 

filters to ITU-T O.171/G.825.

 

 

 

 

 

● STM-1o/STM-1e, plus all the capability of option A3L

A3V

2

 

 

 

 

 

 

● STM-4o/STM-1o/STM-1e, plus all the capability of option A3L

A3N

2

 

 

 

 

 

 

 

 

 

† 8 and 140 Mb/s jitter measurement requires a PDH option with 8 and 140 Mb/s

 

 

 

 

 

 

 

 

 

 

interface to be fitted

 

 

 

 

 

 

 

 

 

 

 

 

Option

No of

Tick

 

code

slots

one

5.ATM services layer test options

Choose one option (if required). As these modules use the interfacing provided by a

 

 

PDH/DSn and ATM test option, must also order ATM option UKN or UKZ (section 1).

 

 

● Provides ATM and AAL capabilities including Channel View, rate history, ....................................... 0YK†

1

graphical CDV, benchmark traffic.

 

 

● As per option 0YK (but occupying two slots) plus native Ethernet LAN

USL†

2

connectivity tests.

 

 

†Option 0YK and USL do not support options A3R and 120 at present. Please refer to module interworking section (pages 6 and 7).

Option

No of

Tick

code

slots

one

6.PDH binary interfaces options

Choose one option (if required). Must also order a PDH and ATM test option (section 1). (Option UH3 does not support options UKZ, 0YK or USL at present.)

● PDH NRZ interfaces: Adds binary Tx clock and data, binary Rx clock and data, ........................... UH3†

1

plus external clock input.

 

● PDH synthesized BER testing bundle : Includes UH3 (binary clock and data), ................................ 200

3

UKK (unstructured BER module) and HP 8647A synthesizer.

 

†Option UH3 does not support options UKZ, 0YK and USL at present. Please refer to module interworking section (pages 6 and 7).

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Contents Effective from February HP 37717C communications performance analyzerContents Your choice of test capability IntroductionExample configurations STM-4o/STM-1o plus jitter ATM services and jitterOC-12c, DS3 structured, HP-IB Optical 3 4 5 6 7 Remote Step EightPDH/SDH and ATM cell layer supported configurations Module interworking sectionSONET/SDH ATM services Layer test Broadband ATM services supported configurationsATM cell test Interfaces STM-1e test InterfacesSONET/SDH test and interfaces options PDH/DSn and ATM test and interfaces optionsWander and jitter generation options Option Tick Code Slots OnePDH binary interfaces options ATM services layer test optionsOption Tick Code Slots One Connectivity testsOptical interfaces options SONET/SDH binary interfaces optionSTM-4 test and optical interfaces Remote-control/external-printer interfaces options Multiple PDH interfaces optionPrinter option Optical adaptor optionsOther options and accessories
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37717C specifications

The HP 37717C is a high-performance modular test and measurement instrument designed to provide unparalleled accuracy and versatility for a wide range of applications. Targeted primarily at engineers and researchers in communications and signal processing, this instrument offers essential features and advanced technologies that cater to the evolving demands of modern testing environments.

One of the main features of the HP 37717C is its exceptional frequency coverage. With the ability to operate from a few hertz up to a staggering 2.65 GHz, it can effectively handle various signals, from low-frequency audio to high-frequency RF applications. This broad range is crucial for telecommunications testing, as it allows engineers to assess components such as amplifiers, mixers, and modulators accurately.

The HP 37717C incorporates state-of-the-art digital signal processing (DSP) technology, allowing for real-time analysis and measurements. This technology enhances the accuracy and speed of data acquisition, making it efficient for both time-sensitive applications and complex signal analyses. Furthermore, it is equipped with advanced error detection capabilities that help identify and correct signal distortions, ensuring the integrity of the data being processed.

Another standout characteristic of the HP 37717C is its modular design. This instrument can be easily integrated into larger test systems, facilitating seamless upgrades and expansions. Users can customize their setups based on specific testing needs, whether that involves adding new measurement capabilities or incorporating additional channels for multi-channel testing.

The instrument also features a user-friendly interface, complete with an intuitive graphical display that enables quick navigation through its wide array of functions and settings. This ease of use enhances productivity and reduces the learning curve for new users, allowing them to focus on their testing objectives rather than struggling with complex controls.

Moreover, the HP 37717C supports various communication protocols and standards, making it adaptable for different industries ranging from aerospace and defense to consumer electronics. Its versatile capabilities ensure that it remains relevant as technology progresses and new standards emerge.

In summary, the HP 37717C stands out in the realm of test and measurement instruments due to its strategic combination of extensive frequency range, advanced DSP technology, modular design, and user-friendly interface. These features make it an indispensable tool for engineers and researchers striving for precision in their testing endeavors.
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