SEM-200D1, SEM-100D1, SEM-100S1, SEM-200S1 specifications
The Garland SEM series, consisting of the SEM-200D1, SEM-100D1, SEM-100S1, and SEM-200S1, represents a significant advancement in the realm of scanning electron microscopes (SEMs). These models are designed for researchers and technicians requiring detailed analysis of materials at the nanoscale level, making them ideal for applications in materials science, electronics, and biological research.The SEM-200D1 is characterized by its dual beam technology, which combines scanning electron microscopy with focused ion beam (FIB) capabilities. This allows users to prepare samples with precision while providing high-resolution imaging. It features a large chamber that accommodates various sample sizes, making it versatile for different experimental setups. The SEM-200D1 offers remarkable imaging resolution down to the sub-nanometer range, along with a wide magnification range, ensuring detailed observation of fine structures.
Next in the series is the SEM-100D1, which serves as a more compact and cost-effective solution without compromising performance. It is equipped with advanced detectors that enhance contrast and brightness of images, making it suitable for observing various materials, including metals, polymers, and biological specimens. With automatic sample recognition and intuitive user interfaces, the SEM-100D1 is user-friendly, allowing for efficient operation even for beginners.
The SEM-100S1 further emphasizes simplicity and efficiency, featuring a streamlined design with a focus on quick sample turnaround. Its rotational sample holder enables 360-degree viewing angles, providing versatile imaging options. This model is ideal for educational purposes or laboratories with high throughput demands, where rapid assessments are essential.
Lastly, the SEM-200S1 stands out with its sophisticated software package that integrates real-time imaging and advanced analysis features. This model supports automated material characterization and quantitative analysis, delivering precise data for research applications. The high-resolution imaging capabilities allow users to explore the intricate details of their samples, facilitating groundbreaking discoveries in their respective fields.
All four models are built with a high-quality vacuum system, ensuring optimal performance and minimizing contamination. They also come equipped with state-of-the-art electron optics that enhance resolution and decrease aberrations. Whether for academic research or industrial applications, the Garland SEM series provides a robust combination of features, technologies, and characteristics tailored to meet the needs of modern material analysis.