JDS Uniphase 10G Applications, Multiple Applications for Multiple Users, 10GigE LAN, 10G FC Testing, 10GigE WAN, 10G SONET/SDH Testing, Multi-Channel10G High Order

Applications

10GigE LAN, 10G FC Testing

•10GigE LAN BERT with A/-B seed

•10G FC BERT with A-/B-seed

•10GigE LAN with MAC/IP traffic

•Sophisticated PCS layer testing with dynamic block errors, coding statistics and block capture

•256 MAC/IP Flows with 256 independent filters

•10 mixed VLAN / MPLS tags

•Enhanced Ethernet Frames VPLS, MAC-in-

MAC

•QoS, service disruption, packet jitter, BERT per flow

•Tree different types of packet jitter: Instantaneous, RFC3550 and absolute

•Online hitless traffic control

•IPv4/IPv6 and packet capture

10GigE WAN, 10G SONET/SDH Testing

•OC-192c/STM-64c BERT and WAN

•Full 10GigE functionality in WAN as per 10GigE LAN

•Dynamic error/alarm insertion including pulse bursts

•Best-in-class service disruption with high level of details

•All pointer sequences

•Performance monitoring G.826/828/829

•Byte capture all SOH/TOH bytes

Multi-Channel 10G High Order

•Generation and analysis of up to 192xSTS- 1/64xAU-3/4

•Analysis of BER, service disruption, errors, alarms in all channels

•Mixed mappings

•STS-1 /3c/6c/9c/12c/24c/48c/192c

•VC-4-2c/3c/4c/8c/16c/64c

•Enhanced through mode with error and alarm injection in multiple channels

•Dynamic error/alarm insertion including pulse bursts

•Best-in-class service disruption with high level of details

•Byte capture all SOH/TOH bytes

OTN OTU2 10/11G Testing

•Standard and overclocked OTU2 line rates

•OTN wrapper/dewrapper testing (RX <> TX rates)

•Support of all TCM layers

•Transfer delay and service disruption

•Unique FEC stress testing with walking pattern

•OH byte capture

•Dynamic error/alarm insertion including pulse bursts

Stressed Eye and Jitter/Wander Testing

(in preparation)

•Stressed eye (SE) generation at all unframed and framed rates at 1550 nm

•User-adjustable OMA, ER, SJ, and VECP

•Stressed receiver sensitivity (SRS) test with pass/fail result using bit error ratio (BER) measurement

•Jitter/wander generation and analysis for all line rates

•Framed and unframed signals with optical and differential electrical interfaces

•TDEV noise wander generation for all interfaces incl. DS1/E1

•Automatic measurements MTJ, FMTJ, JTF,

MTW, WTF

•Online TIE/MTIE/TDEV wander measurements

COMMUNICATIONS TEST &

MEASUREMENT SOLUTIONS

Multiple Applications for Multiple Users

Combining broadest range of technologies with real multi-user capabilities the JDSU ONT-503/506/512 is the lab tool enabling users to get the most out of their testing time.

Highly developed Tcl- and C-libraries together with LW CVI drivers facilitate and speed the development of automated test scripts

40/43G with Jitter

For analyzing electrical and optical 40/43 Gb/s SDH/SONET/OTU-3 systems including jitter and wander functionality in one unit.

High Accurate Jitter up to 10.7 Gb/s

For qualifying electrical and optical inputs and outputs of systems 155M up to 10.7 Gb/s.The jitter receiver provides the highest accuracy on the market. The solution complies to ITU-T O.172 AppendixVII andVIII.Wander measurements are processes with up to 1000 samples/s.

OTN all rates

For system testing with all G.709 mappings OTU-1/2/3 and overclocked OTU-2. Various clients are supported together with the wrapper/de-wrapper test functionality

Ethernet up to 10GigE

For testing native Ethernet interfaces 10/100/1000M and GigE and verifying real interworking with the NewGen solution. 10GigE LAN/WAN allows enhanced testing on PCS and MAC/IP layers.

MultiChannel Low Order

Analyses all 1000 channels of a 2.5 Gb/s bandwidth in 2.5 and 10 Gb/s signals. Uses multiple service disruption measurements to see all detailed effects during switching processes in SDH/ SONET systems. No blind spots.

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