3 Probe Selection
| Introduction |
| The 8700 series RF measurement system offers a very broad |
| selection of probes. The factors that you should consider in |
| selecting the probe, or probes, best suited for your task are |
| described in this section. |
| Key Factors in Selecting a Probe |
FREQUENCY | The probe frequency range should include the frequencies of all |
RANGE | the emitters to be surveyed at one time. |
POWER | The measurement range of the probe should be adequate for |
DENSITY | the field levels that you anticipate, i.e., do you expect strong |
OR FIELD | fields or weak fields? Probes give more accurate and more |
STRENGTH | stable readings when they are not used at the extreme low end |
| of their sensitivity range. Therefore, if you anticipate measuring |
| very weak fields, select a probe with a lower power |
| measurement range to get greater sensitivity. In contrast, higher |
| power probes give additional safety margins, especially at |
| microwave frequencies where field strength can change rapidly |
| with a small change in distance to the source. Select a probe |
| with a higher power |
| anticipate measuring high level fields. |
ELECTRIC FIELD VERSUS MAGNETIC FIELD
Most standards recommend that you measure both electric (E) and magnetic (H) fields below 300 MHz (due to the possibility that measurements may be made in the near field). Since most experts agree that the electric field poses a greater danger at lower frequencies due to induced and contact currents that can occur, the electric field is normally measured first. Higher frequency measurements are normally made of only the electric field since measurements will generally be made in the far field.
Chapter 3 Probe Selection | 9 |