Indicates that there is a 3 kX pull-up resistor on these outputs when they are disabled.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

TL/F/5012 – 1

 

 

 

 

 

 

FIGURE 1. DP8409A Block Diagram

 

 

 

 

 

 

 

 

 

 

 

 

 

TABLE II. DP8409A Mode Select Options

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Mode

(RFSH)

M1

M0

 

 

Mode of Operation

 

 

 

Conditions

 

M2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

RF I/O e

 

 

 

 

0

0

 

0

0

Externally Controlled Refresh

EOC

 

 

 

 

 

 

 

 

 

 

RF I/O e Refresh Request

 

 

1

0

 

0

1

Auto Refresh—Forced

(RFRQ)

 

 

 

 

 

 

 

 

 

 

RF I/O e

 

 

2

0

 

1

0

Internal Auto Burst Refresh

EOC

 

 

 

 

 

 

 

 

 

 

RF I/O e

 

 

3a

0

 

1

1

All RAS Auto Write

EOC

 

 

 

 

 

 

 

 

 

 

 

3b

0

 

1

1

Externally Controlled All RAS Access

All RAS Active

 

 

 

 

 

 

 

 

 

 

 

 

 

4

1

 

0

0

Externally Controlled Access

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

5

1

 

0

1

Auto Access, Slow tRAH, Hidden Refresh

 

 

 

 

 

 

 

6

1

 

1

0

Auto Access, Fast tRAH

 

 

 

 

 

 

 

7

1

 

1

1

Set End of Count

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Modes 0, 3b, and 4 provide full control of access and re- fresh for systems with external memory controllers or for special purpose applications. Here all timing can be directly controlled by the external system as shown in Figure 2 .

Modes 1, 5 and 6 provide on-chip automatic access se- quencing with hidden refresh capability. A graphic example of the automatic access modes of the DP8409A is shown in Figure 3 . All DRAM access timing and control is generated from one input strobe, RASIN; no external clock is required. On-chip delays insure proper address and control sequenc- ing once the valid parallel address is presented to the fall- through input latches of the DP8409A. When the RASIN transitions high-to-low, the decoded RAS output transitions low, strobing the row address into the DRAM array. An on- chip delay automatically generates a guaranteed selectable (mode 5 or 6) row address hold time. At this point, the

DP8409A switches the address outputs from the row latch to the column latch. Then another on-chip delay generates a guaranteed column address set-up time before CAS, so that the CAS output automatically strobes the column ad- dress into the DRAM array. Read or write cycles are con- trolled by the system through independent control of the WE buffer that is provided on-chip to minimize delay skewing. The automatic access mode makes the dynamic RAM ap- pear static with respect to access timing. In this mode, only one signal, RASIN, is needed after valid parallel addresses are presented to the DP8409A to initiate proper access se- quencing. Access timing (RASIN to CAS), with full output loading of 88 DRAMs in the auto access mode, is deter- mined by the dash number given on the DP8409A data sheet. All performance characteristics are specified over the full operating temperature and supply ranges.

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National Instruments DP8400 specifications Rfsh, Eoc

DP8400 specifications

The National Instruments DP8400 is a robust and versatile data acquisition and control platform that stands out in the landscape of advanced instrumentation solutions. Designed to meet the demands of both academic and industrial applications, the DP8400 serves as a comprehensive tool for engineers and researchers alike, facilitating data collection, processing, and analysis in real-time.

One of the key features of the DP8400 is its high-performance data acquisition capability. It supports a wide range of input types, including analog, digital, and thermocouples, allowing users to connect various sensors and devices easily. With sampling rates of up to 1 MHz and resolutions of up to 24 bits, this instrument ensures precise and reliable data capture across diverse applications.

The DP8400 also integrates advanced signal processing technologies, including built-in filtering, signal conditioning, and data preprocessing capabilities. These features enable users to refine their measurements and extract meaningful insights from raw data, reducing the need for extensive post-processing. This is particularly beneficial in complex experiments where signal noise can interfere with results.

Another notable characteristic of the DP8400 is its versatile connectivity options. Users can connect to the device using USB, Ethernet, or wireless interfaces, facilitating seamless integration into existing laboratory setups or remote monitoring configurations. The device is compatible with various software platforms, including LabVIEW and MATLAB, providing users with familiar environments for programming and data visualization.

The DP8400 also boasts robust data storage capabilities, allowing for high-speed data logging and management. With onboard memory and support for external storage devices, users can capture extensive datasets without loss of performance. This is especially useful in long-duration experiments or when conducting time-series analysis.

In terms of durability, the DP8400 is built to withstand challenging environments, featuring rugged housing and protection against dust and moisture. This makes it suitable for both laboratory and field applications, providing reliability in diverse operating conditions.

Overall, the National Instruments DP8400 represents a powerful solution for data acquisition and analysis, combining high performance, advanced features, and exceptional flexibility. Whether for educational purposes, research projects, or industrial applications, the DP8400 is an essential tool for engineers and scientists looking to streamline their data collection and enhance their analytical capabilities. With its user-friendly interface and extensive support, it empowers users to explore new frontiers in measurement science.