Parameter

Symbol

Conditions

Value

Collector-emitter breakdown

BVCEO

IC = 1 mA; IB = 0

3.2 V

voltage

 

 

 

 

Maximum collector current

IC(max)

 

 

40 mA

Transition frequency

fT

VCE = 2 V; IC = 25 mA; f = 2 GHz

68 GHz

 

 

VCE = 2 V; IC = 5 mA; f = 1.8 GHz; Γs = Γopt

0.4 dB

Noise figure

NF

VCE = 2 V; IC = 5 mA; f = 2.4 GHz; Γs = Γopt

0.45 dB

 

 

 

 

 

VCE = 2 V; IC = 5 mA; f = 5.8 GHz; Γs = Γopt

0.7 dB

 

 

VCE = 2

V; IC = 5 mA; f = 12 GHz; Γs = Γopt

1.0 dB

 

 

VCE = 2

V; IC = 25 mA; f = 1.8 GHz

26.6 dB

Maximum stable power gain

MSG / GP(max)

VCE = 2

V; IC = 25 mA; f = 2.4 GHz

25.5 dB

 

 

 

 

 

VCE = 2 V; IC = 25 mA; f = 12 GHz

13 dB

 

 

VCE = 2

V; IC = 25 mA; f = 5.8 GHz

17 dB

Quick reference data

Transition frequency as a function of collector current (typical values)

Gain as a function of frequency (typical values)

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©2006 NXP B.V.

 

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Date of release: October 2006

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NXP Semiconductors BFU725F manual Parameter Symbol Conditions Value, Gain as a function of frequency typical values

BFU725F specifications

NXP Semiconductors BFU725F is a highly regarded RF transistor that supports a wide range of applications, particularly in the fields of wireless communications and RF amplification. This device is part of NXP’s extensive portfolio designed for high-frequency performance and efficiency, complementing their commitment to innovation in the semiconductor industry.

One of the primary features of the BFU725F is its frequency range capability. It operates effectively up to 6 GHz, making it suitable for applications such as GSM, WCDMA, Wi-Fi, and Bluetooth technologies. This versatility allows designers to utilize the BFU725F in various wireless systems, enhancing performance in both consumer and industrial products.

The BFU725F is built using advanced SiGe (silicon-germanium) technology. This technology provides superior performance over conventional silicon transistors, particularly in terms of gain, bandwidth, and junction capacitance. The SiGe construction of the BFU725F allows it to achieve a high transition frequency (fT), which is critical for operating at higher frequencies with increased efficiency and lower power consumption.

Another notable characteristic of the BFU725F is its excellent noise figure performance. The low-noise capabilities of this transistor make it an ideal choice for applications that require high sensitivity, such as RF front ends in receivers. This feature ensures that the signal integrity is maintained, even in challenging environments where interference might be present.

The BFU725F is packaged in a compact SOT-23 form factor, which facilitates ease of integration into various circuit designs without taking up substantial board space. This small size, coupled with its impressive thermal performance, allows for dependable operation in both mobile devices and fixed installations.

Reliability is also a notable attribute of the BFU725F. NXP Semiconductors has designed this transistor with stringent quality controls and standards to ensure consistency in performance across different production batches. This reliability assures engineers and manufacturers that the BFU725F will deliver optimal results over its lifespan.

In summary, the NXP Semiconductors BFU725F combines advanced SiGe technology with a frequency range of up to 6 GHz, low noise performance, and a compact package design. These attributes make it an excellent choice for varied RF applications in today’s increasingly connected world, aligning with NXP's dedication to providing high-performance semiconductor solutions.