SanDisk 5000 2.5 System Reliability

SanDisk uSSD 5000 Product Manual

2.5 System Reliability

Table 5: Reliability

Specification Parameters

Data Reliability Error detection / error correction based on

BCH algorithm

Data integrity after power loss Data is guaranteed after power loss

Bad blocks Transparent bad block management

Wear-leveling Dynamic and Static Wear-leveling

The reliability figure of merit most often used for electronic equipment is Mean

Time To Failure (MTTF). SanDisk estimates MTTF using a prediction

methodology based on reliability data for the individual components in

SanDisk products.

Component data comes from several sources: device life tests, failure analysis

of earlier equipment, device physics, and field returns.

SanDisk uses following methods to predict reliability:

• Telcordia Special Report SR-332, Reliability Prediction Procedure for

Electronic Equipment (RPP).

• British Telecom Industry HRD5, Handbook of Reliability Data for

Electronic Components used in Telecommunication System.

Table 6 summarizes the MTTF prediction results for various uSSD

configurations. The analysis was performed using a RAM Commander™ failure

rate prediction.

• Failure Rate: The total number of failures within an item population,

divided by the total number of life units expended by that population,

during a particular measurement interval under stated condition.

• Mean Time To Failures (MTTF): A basic measure of reliability for

repairable items: The mean number of life units during which all parts of

the item perform within their specified limits, during a particular

measurement interval under stated conditions.

Table 6: uSSD MTTF

Product Condition MTTF (Hours)

1GB, 2GB, 4GB Telcordia SR-332, GB, 25°C 4M

8GB Telcordia SR-332, GB, 25°C 3M