Sony Singapore model, Hong Kong model, 4-216-349-5 service manual Selecting the Test Mode, Group

Models: 4-216-349-5 UK model 4-216-349-3 Australian model 4-216-349-4 Singapore model Hong Kong model 4-216-349-0 US model 4-216-349-1 Canadian model 4-216-349-2 AEP

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4-5. SELECTING THE TEST MODE

There are 24 types of test modes as shown below. The groups can be switched by rotating the AMS knob. After selecting the group to be used, press the YES button. After setting a certain group, rotating the AMS knob switches between these modes.

Refer to “Group” in the table for details selected.

All items used for servicing can be treated using group S. So be carefully not to enter other groups by mistake.

Display

Contents

Mark

 

 

Group (*)

 

 

 

 

 

 

 

 

 

TEMP CHECK

Temperature compensation offset check

 

 

C

 

S

 

 

 

 

 

 

 

 

 

LDPWR CHECK

Laser power check

 

 

C

 

S

 

 

 

 

 

 

 

 

 

EF MO CHECK

Traverse (MO) check

 

 

C

 

S

 

 

 

 

 

 

 

 

 

EF CD CHECK

Traverse (CD) check

 

 

C

 

S

 

 

 

 

 

 

 

 

 

FBIAS CHECK

Focus bias check

 

 

C

 

S

 

 

 

 

 

 

 

 

 

S curve CHECK

S letter check

(X)

 

C

 

 

 

 

 

 

 

 

 

 

 

VERIFY MODE

Non-volatile memory check

(X)

 

C

 

 

 

 

 

 

 

 

 

 

 

DETRK CHECK

Detrack check

(X)

 

C

 

 

 

 

 

 

 

 

 

 

 

TEMP ADJUST

Temperature compensation offset adjustment

 

 

 

A

S

 

 

 

 

 

 

 

 

 

LDPWR ADJUST

Laser power adjustment

 

 

 

A

S

 

 

 

 

 

 

 

 

 

EF MO ADJUST

Traverse (MO) adjustment

 

 

 

A

S

 

 

 

 

 

 

 

 

 

EF CD ADJUST

Traverse (CD) adjustment

 

 

 

A

S

 

 

 

 

 

 

 

 

 

FBIAS ADJUST

Focus bias adjustment

 

 

 

A

S

 

 

 

 

 

 

 

 

 

EEP MODE

Non-volatile memory control

(X) (!)

 

 

 

 

D

 

 

 

 

 

 

 

 

Impossible

No function

(X)

 

 

 

 

D

 

 

 

 

 

 

 

 

ERR DP MODE

Error history display, clear

 

 

 

 

S

 

 

 

 

 

 

 

 

 

ADJ CLEAR

Initialization of non-volatile memory of adjustment value

 

 

 

A

S

 

 

 

 

 

 

 

 

 

AG Set (MO)

Auto gain output level adjustment (MO)

 

 

 

A

S

 

 

 

 

 

 

 

 

 

AG Set (CD)

Auto gain output level adjustment (CD)

 

 

 

A

S

 

 

 

 

 

 

 

 

 

Iop Read

IOP data display

 

 

C

 

S

 

 

 

 

 

 

 

 

 

Iop Write

IOP data write

 

 

 

A

S

 

 

 

 

 

 

 

 

 

S40 @@.@@

Microprocessing version display

 

 

C

 

S

 

 

 

 

 

 

 

 

 

CPLAY MODE

Continuous play mode

 

 

C

A

S

D

 

 

 

 

 

 

 

 

CREC MODE

Continuous recording mode

 

 

C

A

S

D

 

 

 

 

 

 

 

 

 

 

Group (*)

 

 

 

 

 

 

C: Check

 

A: Adjust

 

 

S: Service

 

D: Develop

• For details of each adjustment mode, refer to “5. Electrical Adjustments”.

For details of “ERR DP MODE”, refer to “Self-Diagnosis Function” on page 2.

If a different mode has been selected by mistake, press the MENU/NO button to exit that mode.

Modes with (X) in the Mark column are not used for servicing and therefore are not described in detail. If these modes are set accidentally, press the MENU/NO button to exit the mode immediately. Be especially careful not to set the modes with (!) as they will overwrite the non-volatile memory and reset it, and as a result, the unit will not operate normally.

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Sony Singapore model, Hong Kong model, 4-216-349-5 service manual Selecting the Test Mode, Group