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Data Retention and Endurance |
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Parameter |
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DATAR |
| Data Retention |
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NVC |
| Nonvolatile STORE Operations |
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Capacitance |
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In the following table, the capacitance parameters are listed.[6] |
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Parameter |
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CIN | Input Capacitance |
| TA = 25°C, f = 1 MHz, |
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COUT | Output Capacitance |
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Thermal Resistance |
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In the following table, the thermal resistance parameters are listed.[6] |
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Parameter |
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ΘJA |
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| Test conditions follow | 46.55 | 45.16 | 55.84 | 46.1 |
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| standard test methods and |
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| thermal impedance, per EIA / |
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ΘJC |
| Thermal Resis- |
| 27.95 | 31.62 | 25.74 | 5.01 |
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R1 963Ω
5.0V |
Output |
30 pF
Figure 6. AC Test Loads
R1 963Ω For
5.0V |
Output |
R2 | 5 pF |
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512Ω |
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AC Test Conditions
Input Pulse Levels | 0 V to 3 V |
Input Rise and Fall Times (10% to 90%) | <5 ns |
Input and Output Timing Reference Levels | 1.5 |
Note
6. These parameters are guaranteed by design and are not tested.
Document Number: | Page 8 of 20 |
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