Cypress CYS25G0101DX-ATC manual Set-up for Testing the TX PLL in Parallel Line Loopback Mode

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CYS25G0101DX-ATC Evaluation Board User’s Guide

6.4 Set-up for Testing the TX PLL in Parallel Line Loopback Mode

Figure 11 illustrates the set-up for testing the TX PLL in Parallel Line Loopback Mode. The equipment list :

1.Evaluation Board – Cypress CYS25G0101DX Evaluation Board

2.Pattern Generator – Tektronix D3186 Pattern Generator

3.Error Detector– Tektronix D3286 Error Detector

4.Pulse Generator - HP 8133A Pulse Generator

5.Power Supply – HP E3631A DC Power Supply

*All equipment in the list is for reference only

Tektronix D3286

Pattern Analyzer

HP 8133A Pulse Generator

(configure to Output = Input Clock divided by 16)

 

 

Tektronix D3186

 

 

 

 

 

Pattern Generator

 

Output+

 

 

 

 

 

 

 

 

 

 

External

 

Output-

 

 

 

 

 

 

 

 

 

 

 

Input

 

 

 

 

 

 

 

 

 

CLK2

 

 

 

 

 

 

 

 

CLK1

 

50Ω Terminator For OUT-

 

 

 

 

IN+

IN- OUT+

 

 

OUT-

 

 

 

 

 

 

 

 

 

 

 

 

 

 

1.Disconnect CLKVCC

2.Remove the OSC

3.Place C400 on C402 and C401 on C403 positions

Cypress CYS25G0101DX

Evaluation BoardHP E3631A

Power Supply

Figure 11. Equipment Set-up For Testing the TX PLL in Parallel Line Loopback Mode

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Contents CYS25G0101DX-ATC Evaluation Board User’s Guide Block Diagram of the CYS25G0101DX Reference Clock Block Schematic Diagram Introduction Txclki Refclk CYS25G0101DX Evaluation Board Lated, if this connector is used Pin Assignment of J2 Header and Description of J9 Header Functional Description of DIP Switch 1 SW1 LED LFI GND Fifoerr Rxclk Output Diagnostic Loopback ModeTXD Input Register 5bytePLL Line LoopbackShifter RX CDR PLL Analog Line LoopbackTXD Parallel Line Loopback TEST0 ModeSet-up for Bert Test Testing HookupEquipment Set-up For Eye Diagram Test Set-up for Eye Diagram TestEquipment Set-up For Jitter Test Sonet Jitter Transfer and Jitter Tolerance TestSet-up for Testing the TX PLL in Parallel Line Loopback Mode Eye Diagram Testing Result Jitter Transfer Testing Result Jitter Tolerance Testing Result Schematic Diagram, PCB Layout and BOM Bill of Material Appendix a Schematic Diagrams CYS25G0101DX Evaluation Board Top Level of CYS25G0101DX Evaluation Board Schematic Diagram Parallel Output Block Schematic Diagram Parallel Input Block Schematic Diagram Signals Block Schematic Diagram Power Supply Block Schematic Diagram Control Block Schematic Diagram Reference Clock Block Schematic Diagram CYS25G0101DX-ATC Evaluation Board User’s Guide CYS25G0101DX Evaluation Board PCB Mechanical Drawing CYS25G0101DX Evaluation Board PCB Top Layer Silk Screen CYS25G0101DX Evaluation Board PCB Top Layer Layout CYS25G0101DX Evaluation Board PCB Top Layer Solder Mask CYS25G0101DX Evaluation Board PCB Power Plane Layout CYS25G0101DX Evaluation Board PCB Ground Plane Layout CYS25G0101DX Evaluation Board PCB Bottom Silk Screen CYS25G0101DX Evaluation Board PCB Bottom Layer Layout CYS25G0101DX Evaluation Board PCB Bottom Solder Mask CYS25G0101DX-ATC Evaluation Board User’s Guide CYS25G0101DX Evaluation Board Lvpecl BOM Page 1 CYS25G0101DX Evaluation Board Lvpecl BOM Page 2 CYS25G0101DX Evaluation Board Lvpecl BOM Page 3 CYS25G0101DX Evaluation Board Lvpecl BOM Page 4 CYS25G0101DX-ATC Evaluation Board User’s Guide CYS25G0101DX Evaluation Board Hstl BOM Page 1 CYS25G0101DX Evaluation Board Hstl BOM Page 2 CYS25G0101DX Evaluation Board Hstl BOM Page 3 CYS25G0101DX Evaluation Board Hstl BOM Page 4

CYS25G0101DX-ATC specifications

The Cypress CYS25G0101DX-ATC is a high-performance, 1 Megabit serial NOR Flash memory device designed for a variety of applications, including automotive, industrial, and consumer electronics. This memory solution offers a range of features and technologies that enhance its performance, reliability, and usability, making it a popular choice among engineers and developers.

One of the main features of the CYS25G0101DX-ATC is its compatibility with a variety of serial interfaces, including SPI (Serial Peripheral Interface). This flexibility allows for easy integration into various system designs while ensuring efficient data transfer speeds. The device supports clock frequencies up to 104 MHz, providing faster read and write operations compared to older generation serial Flash memories. Additionally, the architecture allows for the execution of code directly from the Flash, enabling reduced boot times in embedded applications.

The device is built on a robust technology platform that ensures longevity and data retention. With a data retention period of up to 20 years and a minimum of 10,000 program/erase cycles, the CYS25G0101DX-ATC is engineered for demanding applications that require reliability over extended periods. This durability is particularly beneficial in automotive and industrial environments where environmental conditions can be harsher than standard consumer applications.

Furthermore, the CYS25G0101DX-ATC features a range of advanced capabilities, including support for deep power-down modes, which help to conserve energy in battery-powered devices. The low-power consumption design minimizes energy usage while maintaining performance, making it ideal for energy-sensitive applications.

Another noteworthy characteristic of the device is its array of security features. The CYS25G0101DX-ATC includes mechanisms for reading, writing, and erasing protection, ensuring that sensitive data is safeguarded from unauthorized access. This is particularly important for applications that handle confidential information.

In summary, the Cypress CYS25G0101DX-ATC combines high performance, advanced technology, and robust security features in a compact package. With its versatile interface options and energy-efficient design, this serial NOR Flash memory device is well-suited for a diverse range of applications, making it a valuable component for modern electronic systems. As industries continue to shift toward smarter technologies, the CYS25G0101DX-ATC will remain a key player in meeting the demands of next-generation products.
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