Cypress CYS25G0101DX-ATC manual Introduction

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CYS25G0101DX-ATC Evaluation Board User’s Guide

1. Introduction

Cypress'sCYS25G0101DXSONETOC-48Transceiverisacommunicationsbuildingblockforhigh-speedSONETdatacommunica- tions. It provides complete parallel-to-serial and serial-to-parallel conversions, clock generation, and clock and data recovery opera- tionsina singlechip,optimizedforfullSONET/SDHcompliance. TheCYS25G0101DX EvaluationBoardis designed forevaluatingas well as understanding the characteristics of the CYS25G0101DX SONET/SDH Transceiver. The CYS25G0101DX SONET/SDH Transceiver Evaluation Board provides the following advantages.

2. Features

•Flexible and easy to operate

•On-board Cypress 120-pin TQFP CYS25G0101DX SONET/SDH Transceiver

•Supports LVPECL and HSTL interfaces

•Dip switch for selecting different diagnostic modes

•Four diagnostic modes – Diagnostic Loopback mode, Line Loopback mode, Analog Line Loopback mode, and factory TEST0 (Parallel Line Loopback) mode

•LFI and FIFO_ERR LEDs

•Onboard oscillator for the REFCLK

•Supports external clock source for the REFCLK

•16-bit RxD, 16-bit TxD bus, RXCLK, TXCLKI, TXCLKO interface

•SMA connectors for CML input and output buffers

•Separate Banana Jacks for all voltage sources for measuring current individually

3. Kit Contents

•CYS25G0101DX Evaluation Board

•Certificate of Compliance

•CYS25G0101DX Evaluation Kit CD

—Users Guide

—Application Notes

—Data Sheet

4. Functional Description

This board can be used to test the CYS25G0101DX in various modes, such as TEST0 (parallel line loopback mode), LINELOOP, LOOPA and LOOPTIME. The REFCLK of the CYS25G0101DX is connected to the onboard 155.52-MHz oscillator. The on-board REFCLK can be replaced by connecting the external reference clock source to J17 and J18. To use the external reference clock source, the C400 and C401 (0.01-∝F cap) have to be removed and placed on C402 and C403 positions. Also, the P2, CLKVCC, has to be disconnected from the power supply (or power down). The CYS25G0101DX Evaluation Board provides an optional optical module interface for connecting to an optical module daughter card.

The block diagram of the CYS25G0101DX is shown in Figure 1. The detailed functional description can be found in the

CYS25G0101DX data sheet. Figure 2 shows the picture of the CYS25G0101DX Evaluation Board and the location of the jumpers. Table 1 is the description of all jumpers and connectors. The bus connectors, J1 and J2, are used to connect to the 16-bit RxD and TxD buses for transferring and receiving the parallel data. Table 2 and Table 3 are the pin definitions of J1 and J2. A multi-function eight-po-

sition Dip switch provides the selection of the different diagnostic modes as well as the control functions. Table 4 is the functional de- scription of the Dip switch SW1. The TEST0 jumper, J6, when closed, is used to enable the factory TEST0 (Parallel Line Loop Back) mode. In the “Parallel Line Loop Back” mode, parallel output buffers are internally jumped to the parallel input buffers. There is no need

touseexternaljumpersfortheheaders.J13,J14,J15,J16andJ4areDifferential CMLinputandoutputandpowersupplyfortheoption- al optical module daughter card. Table 5 idescribes the optical module interface and Table 6 idescribes the LED. Figure 3 shows the

jumper orientations of the CYS25G0101DX Evaluation Board.

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Contents CYS25G0101DX-ATC Evaluation Board User’s Guide Block Diagram of the CYS25G0101DX Reference Clock Block Schematic Diagram Introduction Txclki Refclk CYS25G0101DX Evaluation Board Lated, if this connector is used Pin Assignment of J2 Header and Description of J9 Header Functional Description of DIP Switch 1 SW1 LED LFI GND Fifoerr Rxclk Diagnostic Loopback Mode TXD Input Register5byte OutputLine Loopback PLLAnalog Line Loopback Shifter RX CDR PLLParallel Line Loopback TEST0 Mode TXDTesting Hookup Set-up for Bert TestSet-up for Eye Diagram Test Equipment Set-up For Eye Diagram TestSonet Jitter Transfer and Jitter Tolerance Test Equipment Set-up For Jitter TestSet-up for Testing the TX PLL in Parallel Line Loopback Mode Eye Diagram Testing Result Jitter Transfer Testing Result Jitter Tolerance Testing Result Schematic Diagram, PCB Layout and BOM Bill of Material Appendix a Schematic Diagrams CYS25G0101DX Evaluation Board Top Level of CYS25G0101DX Evaluation Board Schematic Diagram Parallel Output Block Schematic Diagram Parallel Input Block Schematic Diagram Signals Block Schematic Diagram Power Supply Block Schematic Diagram Control Block Schematic Diagram Reference Clock Block Schematic Diagram CYS25G0101DX-ATC Evaluation Board User’s Guide CYS25G0101DX Evaluation Board PCB Mechanical Drawing CYS25G0101DX Evaluation Board PCB Top Layer Silk Screen CYS25G0101DX Evaluation Board PCB Top Layer Layout CYS25G0101DX Evaluation Board PCB Top Layer Solder Mask CYS25G0101DX Evaluation Board PCB Power Plane Layout CYS25G0101DX Evaluation Board PCB Ground Plane Layout CYS25G0101DX Evaluation Board PCB Bottom Silk Screen CYS25G0101DX Evaluation Board PCB Bottom Layer Layout CYS25G0101DX Evaluation Board PCB Bottom Solder Mask CYS25G0101DX-ATC Evaluation Board User’s Guide CYS25G0101DX Evaluation Board Lvpecl BOM Page 1 CYS25G0101DX Evaluation Board Lvpecl BOM Page 2 CYS25G0101DX Evaluation Board Lvpecl BOM Page 3 CYS25G0101DX Evaluation Board Lvpecl BOM Page 4 CYS25G0101DX-ATC Evaluation Board User’s Guide CYS25G0101DX Evaluation Board Hstl BOM Page 1 CYS25G0101DX Evaluation Board Hstl BOM Page 2 CYS25G0101DX Evaluation Board Hstl BOM Page 3 CYS25G0101DX Evaluation Board Hstl BOM Page 4

CYS25G0101DX-ATC specifications

The Cypress CYS25G0101DX-ATC is a high-performance, 1 Megabit serial NOR Flash memory device designed for a variety of applications, including automotive, industrial, and consumer electronics. This memory solution offers a range of features and technologies that enhance its performance, reliability, and usability, making it a popular choice among engineers and developers.

One of the main features of the CYS25G0101DX-ATC is its compatibility with a variety of serial interfaces, including SPI (Serial Peripheral Interface). This flexibility allows for easy integration into various system designs while ensuring efficient data transfer speeds. The device supports clock frequencies up to 104 MHz, providing faster read and write operations compared to older generation serial Flash memories. Additionally, the architecture allows for the execution of code directly from the Flash, enabling reduced boot times in embedded applications.

The device is built on a robust technology platform that ensures longevity and data retention. With a data retention period of up to 20 years and a minimum of 10,000 program/erase cycles, the CYS25G0101DX-ATC is engineered for demanding applications that require reliability over extended periods. This durability is particularly beneficial in automotive and industrial environments where environmental conditions can be harsher than standard consumer applications.

Furthermore, the CYS25G0101DX-ATC features a range of advanced capabilities, including support for deep power-down modes, which help to conserve energy in battery-powered devices. The low-power consumption design minimizes energy usage while maintaining performance, making it ideal for energy-sensitive applications.

Another noteworthy characteristic of the device is its array of security features. The CYS25G0101DX-ATC includes mechanisms for reading, writing, and erasing protection, ensuring that sensitive data is safeguarded from unauthorized access. This is particularly important for applications that handle confidential information.

In summary, the Cypress CYS25G0101DX-ATC combines high performance, advanced technology, and robust security features in a compact package. With its versatile interface options and energy-efficient design, this serial NOR Flash memory device is well-suited for a diverse range of applications, making it a valuable component for modern electronic systems. As industries continue to shift toward smarter technologies, the CYS25G0101DX-ATC will remain a key player in meeting the demands of next-generation products.
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