Transcend Information TS60GSSD25D-M, TS120GSSD25D-M Smart Write Log Sector subcommand D6h

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TS60GSSD25D-M

2.5” Solid State Drive

TS120GSSD25D-M

 

 

Selective self-test log structure

 

SMART Write Log Sector (subcommand D6h)

This command writes 512 bytes of data to the specified log sector. LBA Low and Sector Count registers shall be set to specify the log address and sector number to be written.

SMART Enable Operations (subcommand D8h)

This subcommand enables access to all SMART capabilities. Prior to receipt of a SMART Enable Operations subcommand, Attribute Values are neither monitored nor saved by the device. The state of SMART—either enabled or disabled—will be preserved by the device across power cycles. Once enabled, the receipt of subsequent SMART Enable Operations subcommands will not affect any of the Attribute Values.

SMART Disable Operations (subcommand D9h)

This subcommand disables all SMART capabilities. After receipt of this subcommand the device disables all SMART operations. Non self-preserved Attribute Values will no longer be monitored. The state of SMART—either enabled or disabled—is preserved by the device across power cycles. Note that this subcommand does not preclude the device's power mode attribute auto saving.

After receipt of the SMART Disable Operations subcommand from the host, all other SMART subcommands except SMART Enable Operations are disabled and will be aborted by the device returning the error code as specified in “SMART Error Codes”.

Any Attribute Values accumulated and saved to volatile memory prior to receipt of the SMART Disable Operations command will be preserved in the device's Attribute Data Sectors. If the device is re-enabled, these Attribute Values will be updated, as needed, upon receipt of a SMART Read Attribute Values or a SMART Save Attribute Values command.

Transcend Information Inc.

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Preliminary V1.0

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Contents Dimensions Placement FeaturesDescription PreliminarySpecifications Page Package Dimensions Pin Layout 228 Pin AssignmentsPin No Pin Name Block Diagram Wear-Leveling algorithm ReliabilityECC algorithm Bad-block managementSupported ATA Command Lists Smart Read Data subcommand D0h Smart subcommand setsSmart Execute Off-line Immediately subcommand D4h Smart Save Attribute Values subcommand D3hSmart Read Log Sector subcommand D5h Attribute ID NumbersError log data structure Command data structure Error data structure Smart Enable Operations subcommand D8h Smart Write Log Sector subcommand D6hSmart Disable Operations subcommand D9h Security Power Segment Pin P11 Sata Optional FeaturesAsynchronous Signal Recovery Identify Device Parameters Word Contents DescriptionTS60GSSD25D-M Transcend Product Form Factor Ordering InformationCapacity