Transcend Information TS120GSSD25D-M, TS60GSSD25D-M dimensions Error data structure

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TS60GSSD25D-M

2.5” Solid State Drive

TS120GSSD25D-M

 

 

Error data structure

 

State field values

Self-test log structure

N is 0 through 20.

The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor. The self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0. When there are descriptor(s), the value is 1 through 21.

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Preliminary V1.0

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Contents Placement Features DimensionsDescription PreliminarySpecifications Page Package Dimensions Pin Assignments Pin Layout 228Pin No Pin Name Block Diagram Reliability Wear-Leveling algorithmECC algorithm Bad-block managementSupported ATA Command Lists Smart subcommand sets Smart Read Data subcommand D0hSmart Save Attribute Values subcommand D3h Smart Execute Off-line Immediately subcommand D4hSmart Read Log Sector subcommand D5h Attribute ID NumbersError log data structure Command data structure Error data structure Smart Write Log Sector subcommand D6h Smart Enable Operations subcommand D8hSmart Disable Operations subcommand D9h Security Sata Optional Features Power Segment Pin P11Asynchronous Signal Recovery Word Contents Description Identify Device ParametersTS60GSSD25D-M Ordering Information Transcend Product Form FactorCapacity
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