Transcend Information TS60GSSD25D-M dimensions Reliability, Wear-Leveling algorithm, ECC algorithm

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TS60GSSD25D-M

2.5” Solid State Drive

TS120GSSD25D-M

Reliability

Wear-Leveling algorithm

The controller supports static/dynamic wear leveling. When the host writes data, the controller will find and use the block with the lowest erase count among the free blocks. This is known as dynamic wear leveling. When the free blocks' erase count is higher than the data blocks', it will activate the static wear leveling, replacing the not so frequently used user blocks with the high erase count free blocks.

ECC algorithm

The controller use Reed Solomon code or BCH code option

Reed Solomon: 6Bytes/sector for 128Bytes spare and 12Bytes/sector for 218Bytes spare

BCH: 8 or 12 bits/sector for 128Bytes spare and 16bits/sector for 218Bytes spare size

Bad-block management

When the flash encounters ECC failed, program fail or erase fail, the controller will mark the block as bad block to prevent the used of this block and caused data lost later on.

Transcend Information Inc.

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Preliminary V1.0

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Contents Preliminary Placement FeaturesDimensions DescriptionSpecifications Page Package Dimensions Pin Layout 228 Pin AssignmentsPin No Pin Name Block Diagram Bad-block management ReliabilityWear-Leveling algorithm ECC algorithmSupported ATA Command Lists Smart Read Data subcommand D0h Smart subcommand setsAttribute ID Numbers Smart Save Attribute Values subcommand D3hSmart Execute Off-line Immediately subcommand D4h Smart Read Log Sector subcommand D5hError log data structure Command data structure Error data structure Smart Enable Operations subcommand D8h Smart Write Log Sector subcommand D6hSmart Disable Operations subcommand D9h Security Power Segment Pin P11 Sata Optional FeaturesAsynchronous Signal Recovery Identify Device Parameters Word Contents DescriptionTS60GSSD25D-M Transcend Product Form Factor Ordering InformationCapacity