SanDisk 5000 2.5 manual Conducted Emissions Test Data, Mode 115 vac, 60 Hz Neutral Conductor

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4.2CONDUCTED EMISSIONS TEST DATA

Mode: 115 vac, 60 Hz.

Neutral Conductor

			Temperature: 75°F		Humidity: 31%
Emission	Test	Analyzer	Site	Emission	CISPR B	CISPR B	CISPR B	CISPR B	Pass/
Frequency	Detector	Reading	Correction	Level	QP	QP	AV	AV	Fail
(MHz)		(dBuV)	Factor	(dBuV)	Limit	Margin	Limit	Margin
			(dB)		(dBuV)	(dBuV)	(dBuV)	(dBuV)
0.157	Qp	56.2	0.2	56.4	65.6	-9.2	55.6		Pass
0.157	Av	33.4	0.2	33.6	65.6	-32.0	55.6	-22.0	Pass
0.186	Qp	54.7	0.2	54.9	64.2	-9.3	54.2		Pass
0.186	Av	21.8	0.2	22.0	64.2	-42.2	54.2	-32.2	Pass
0.212	Qp	42.4	0.2	42.6	63.1	-20.5	53.1	-10.5	Pass
0.221	Qp	43.7	0.2	43.9	62.8	-18.9	52.8	-8.9	Pass
0.265	Qp	46.6	0.2	46.8	61.3	-14.5	51.3	-4.5	Pass
0.320	Qp	54.0	0.3	54.3	59.7	-5.4	49.7		Pass
0.320	Av	29.3	0.3	29.6	59.7	-30.1	49.7	-20.1	Pass
0.372	Qp	51.7	0.3	52.0	58.5	-6.5	48.5		Pass
0.372	Av	30.9	0.3	31.2	58.5	-27.3	48.5	-17.3	Pass
0.710	Pk	40.4	0.2	40.6	56.0	-15.4	46.0	-5.4	Pass
1.650	Pk	35.5	0.7	36.2	56.0	-19.8	46.0	-9.8	Pass
4.450	Pk	35.6	1.3	36.9	56.0	-19.1	46.0	-9.1	Pass
15.070	Pk	25.2	2.3	27.5	60.0	-32.5	50.0	-22.5	Pass
17.640	Pk	28.2	2.5	30.7	60.0	-29.3	50.0	-19.3	Pass
25.100	Pk	29.4	2.7	32.1	60.0	-27.9	50.0	-17.9	Pass

Phase Conductor

				Temperature: 75°F			Humidity: 31%
	Emission	Test	Analyzer	Site	Emission		CISPR B		CISPR B	CISPR B	CISPR B	Pass/
	Frequency	Detector	Reading	Correction		Level	QP		QP	AV	AV	Fail
	(MHz)		(dBuV)	Factor		(dBuV)	Limit		Margin	Limit	Margin
				(dB)			(dBuV)		(dBuV)	(dBuV)	(dBuV)
	0.155	Qp	58.5	0.2	58.7		65.7	-7.0		55.7		Pass
	0.155	Av	34.7	0.2	34.9		65.6	-30.7		55.6	-20.7	Pass
	0.186	Qp	54.5	0.2	54.7		64.2	-9.5		54.2		Pass
	0.186	Av	20.8	0.2	21.0		64.2	-43.2		54.2	-33.2	Pass
	0.213	Qp	52.2	0.2	52.4		62.7	-10.3		52.7		Pass
	0.213	Av	38.1	0.2	38.3		63.1	-24.8		53.1	-14.8	Pass
	0.265	Qp	46.6	0.2	46.8		61.3	-14.5		51.3	-4.5	Pass
	0.294	Qp	41.0	0.3	41.3		60.4	-19.1		50.4	-9.1	Pass
	0.377	Qp	39.8	0.3	40.1		58.3	-18.2		48.3	-8.2	Pass
	0.423	Qp	39.6	0.2	39.8		57.4	-17.6		47.4	-7.6	Pass
	0.500	Pk	38.5	0.2	38.7		56.0	-17.3		46.0	-7.3	Pass
	2.740	Pk	31.2	1.0	32.2		56.0	-23.8		46.0	-13.8	Pass
	9.910	Pk	24.0	1.9	25.9		60.0	-34.1		50.0	-24.1	Pass
	18.640	Pk	28.0	2.6	30.6		60.0	-29.4		50.0	-19.4	Pass
	25.070	Pk	29.8	2.7	32.5		60.0	-27.5		50.0	-17.5	Pass
	28.850	Pk	22.2	3.1	25.3		60.0	-34.7		50.0	-24.7	Pass
Result: PASS
Test Personnel:
	Jon Wilson										April 10, 2007
	Tester					Signature					Date of Test

SanDisk Corporation	Page 10 of 17
DoC Report
2006137
04/27/07