Dell JSM-6060LV manual Introduction, Safety

J E O L J S M - 6 0 6 0 L V S C A N N I N G E L E C T R O N M I C R O S C O P E 1

Introduction

he JEOL JSM-6060LV is a state-of-the-art scanning electron microscope that features Ta low vacuum for observation of non-conductive specimens, a fully automated electron

gun, a backscattered electron detector for atomic number contrast imaging, fully integrated digital control, motorized x-y stage, and a NORAN System 6 elemental

analysis system (see separate operating instructions for the NORAN system). Best of all, the JEOL JSM-6060LV scanning electron microscope is user-friendly and easy to operate.

Safety

The scanning electron microscope is a relatively safe instrument.. You can do much more damage to it than it can do to you. When the electron beam is turned on, some x-rays are produced as a result of electron beam interaction with the sample, but these x-rays are of relatively low energy and do not escape the sample chamber. The instrument also produces some radio frequency energy.

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