Agilent Technologies E7402A, E7405A, E7404A Tracking Generator Output Power Activated in Log Sweep

Page 81

Making Complex Measurements

Making Stimulus Response Measurements

Figure 2-9 Tracking Generator Output Power Activated in Log Sweep

10.Put the sweep time of the analyzer into stimulus response auto coupled mode by pressing Sweep, then Swp Coupling (SR). See Figure 2-9. Auto coupled sweep times are usually much faster for stimulus response measurements than they are for spectrum analyzer (SA) measurements. Adjust the reference level if necessary to place the signal on screen.

11.To make a transmission measurement accurately, the frequency

 

response of the test system must be known. Normalization is used to

 

eliminate this error from the measurement. To measure the

 

frequency response of the test system, connect the cable (but not the

 

DUT) from the tracking generator output to the analyzer input.

 

Press Trace/View, More, Normalize, Store Ref (1→ 3), Normalize (On).

 

This will activate the trace 1 minus trace 3 function and display the

 

results in trace 1. The normalized trace or flat line represents 0 dB

 

return loss. Normalization occurs each sweep.

 

Since the calibration trace is stored in trace 3, changing trace 3 to

NOTE

 

Clear Write, Max Hold, or Min Hold will invalidate the normalization.

 

12.Reconnect the DUT to the analyzer. Note that the units of the

 

reference level have changed to dB, indicating that this is now a

 

relative measurement. Refer to Figure 2-10.

 

13.Press Trace/View, More, Normalize, Norm Ref Posn to change the

 

normalized reference position. Arrowheads at the left and right

 

edges of the graticule mark the normalized reference position. Using

 

the knob results in a change in the position of the normalized trace,

 

within the range of the graticule. Refer to Figure 2-10.

Chapter 2

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Contents Signal Analysis Measurement Guide Safety Information Warranty Limitation of Warranty Contents Demodulating and Listening to an AM Signal Making Basic Measurements What is in This Chapter Test Equipment Test Equipment Specifications Recommended ModelSignal Comparison Example Comparing SignalsPlacing a Marker on the 10 MHz Signal Using the Marker Delta Function Frequency and Amplitude Difference Between Signals Resolving Signals of Equal Amplitude Press SPAN, 2, MHz to bring the signal to center screen Resolving Signals ExampleUnresolved Signals of Equal Amplitude Or linked to the center frequency Resolving Small Signals Hidden by Large Set one source to 300 MHz at − 10 dBm 10 Signal Resolution with a 10 kHz Resolution Bandwidth 12 Signal Resolution with a 30 kHz Resolution Bandwidth Better Frequency Measurement Example Making Better Frequency Measurements13 Using Marker Counter Decreasing the Frequency Span Example Decreasing the Frequency Span Around the Signal14 Detected Signal 16 After Zooming In on the Signal Tracking Signal Drift Example Tracking Drifting Signals17 Signal With Default Span 19 Signal With 500 kHz Span 21 Using Signal Tracking to Track a Drifting Signal 22 Signal With Default Span 24 Signal With 500 KHz Span 25 Viewing a Drifting Signal With Max Hold and Clear Write Measuring Low Level Signals Example Measuring Low Level Signals26 Low-Level Signal 28 Using 0 dB Attenuation 29 Decreasing Resolution Bandwidth 30 30 kHz Video Bandwidth 31 Decreasing Video Bandwidth 32 Without Video Averaging 33 Using the Video Averaging Function Identifying Distortion Products Distortion from the AnalyzerIdentifying Analyzer Generated Distortion Example 34 Harmonic Distortion 36 RF Attenuation of 10 dB Identifying TOI Distortion Example Third-Order Intermodulation Distortion38 Third-Order Intermodulation Equipment Setup 39 Measuring the Distortion Product 40 Measuring the Distortion Product Signal-to-Noise Measurement Example Measuring Signal-to-Noise= 70 dB/Hz + 10 × log 30 kHz = -25.23 dB ⁄ 30 kHz Noise Measurement Example Making Noise Measurements42 Setting the Attenuation 43 Activating the Noise Marker 45 Increased Resolution Bandwidth 46 Noise Marker in Signal Skirt MHz 48 Viewing Power Between Markers 49 Measuring the Power in the Span Demodulating an AM Signal Example 50 Viewing an AM Signal 51 Measuring Modulation In Zero Span 52 Measuring Modulation In Zero Span 54 Measuring Time Parameters 55 Continuous Demodulation of an AM Signal Demodulating a FM Signal Example Demodulating FM Signals56 Establishing the Offset Point 57 Determining the Offset Demodulate the FM Signal 58 Demodulating a Broadcast Signal Making Complex Measurements Required Test Equipment What’s in This ChapterMaking Stimulus Response Measurements Using An Analyzer With a Tracking GeneratorWhat Are Stimulus Response Measurements? Stepping Through a Transmission MeasurementTransmission Measurement Test Setup Tracking Generator Output Power Activated Decrease the Resolution Bandwidth to Improve Sensitivity Measure the Rejection Range Measuring Device Bandwidth Tracking Generator Unleveled ConditionExample DB Bandwidth Measurement at -3 dB N dB Bandwidth Measurement at -60 dB Measuring Stop Band Attenuation Using Log SweepScale Type Log Tracking Generator Output Power Activated in Log Sweep 10 Normalized Trace After Reconnecting DUT 12 Minimum Stop Band Attenuation Example Making a Reflection Calibration MeasurementReflection Calibration 14 Short Circuit Normalized Measuring the Return LossVswr Demodulating and Listening to an AM Signal Example Demodulating and Listening to an AM SignalNext Pk Right, or Next Pk Left Sweep Time, 5, s 17 Continuous Demodulation of an AM Signal Demodulating and Listening to an AM Signal

E7402A, E7405A, E7404A, E7401A, E7403A specifications

Agilent Technologies, a leader in test and measurement solutions, offers a range of spectrum analyzers designed to meet the evolving demands of the electronics industry. The E7403A, E7401A, E7404A, E7405A, and E7402A are prominent models that embody advanced features and technologies, enhancing performance, accuracy, and user experience.

The E7403A is recognized for its high-quality performance and wide frequency range. This model offers frequency coverage from 9 kHz to 3 GHz, making it suitable for both commercial and academic research applications. With a phase noise of -100 dBc/Hz at 10 kHz offset, it delivers exceptional sensitivity. The E7403A also features a built-in tracking generator, facilitating effective signal generation for testing.

Next in line, the E7401A provides similar frequency coverage but is optimized for portable functionality. Weighing significantly less than its counterparts, it is easy to transport, making it ideal for field applications. Users benefit from its fast sweep speed of up to 3 GHz, which is crucial in quickly identifying and analyzing signals.

The E7404A excels in its comprehensive analysis capabilities. With a frequency range extending up to 6 GHz, it supports more demanding applications, including wireless communications and satellite technology. Its advanced digital signal processing capabilities enable the analysis of complex modulated signals, providing engineers with the data needed to troubleshoot and optimize system performance.

The E7405A is a highly versatile model that offers frequency coverage from 9 kHz to 20 GHz. This wide frequency range, combined with high dynamic range, supports the testing of various electronic devices and systems. It features advanced measurement options including occupied bandwidth, adjacent channel power, and sensitivity measurements, which are critical for compliance testing in communication systems.

Lastly, the E7402A is designed for users who require a spectrum analyzer with enhanced functionality at a competitive price. It reaches frequencies of up to 1.5 GHz, making it suitable for various applications including RF design, development, and manufacturing. Its user-friendly interface ensures that both novice and experienced users can navigate its features with ease.

In conclusion, Agilent Technologies' E7403A, E7401A, E7404A, E7405A, and E7402A spectrum analyzers provide a robust set of features tailored to meet diverse industry needs. Utilizing sophisticated technologies, these models ensure precise and efficient signal analysis, making them indispensable tools for engineers and researchers in the fast-paced world of electronics.
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