SP EC N O.

MT 220 WW 01 V.0

PAG E :

18/23

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D. Reliability test items
Test Item Test Condition Judgment Remark
High temperat ure storage 60°C, 24 0Hrs Note 1 Not e 2
Low temperatu re storage -25°C, 240Hrs Note 1 Not e 2
High temperat ure & high
humidity oper ation
40°C, 90%RH, 240Hrs
(No condensati on)
Note 1 Not e 2
High temperat ure operation 50°C, 240Hrs Note 1 Note 2
Low temperatu re operation 0°C, 240Hrs Note 1 Not e 2
Thermal Shoc k
(non-operatio n)
-20°C~60°C
1Hr, 10mins, 1Hr, 10 0cycles
Note 1 Not e 2
Electrostatic di scharge (ESD)
(non-operatio n)
Contact:+/-8kV, 150pF (330ohms),
25 times/1 po int, 1 time/1 sec
Air discharg e:+/-
15kV, 150pF(330o hms),
25 times/1 po int, 1 time/1 sec
Note 1 Not e 2
Vibration
(non-operatio n)
Vibration lev el : 1.5G
Bandwidth : 10- 300Hz
Waveform : sine wave,
sweep rate : 10min
30 min for eac h direction X, Y, Z
(1.5 Hrs in to tal)
Note 1 Not e 2
Mechanical S hock
(non-operatio n)
Shock level : 50G, 11ms
Waveform : Half sine wave
Direction : ±X, ±Y, ±Z
One time each direction
Note 1 Not e 2
MTBF Demonst ration 40,000 hour s with confidenc e level 90% Note 1 Note 3

Note 1:

Pass: Norma l disp lay ima ge with no ob vious n on-uni formity and n o line defect . Parti al

tran sforma tion of the m odule p arts sh ould b e igno red.

Fail : No d isplay image , obvio us non -unifo rmity, o r line defects .

Note 2:

Evaluation should be tested after storage at room temperature for one hour.

Note 3

: The MTBF (exclude the CCFL ) calculation is ba sed on the assumption that the failure rate

distribution meets the Exponential Model.