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Agilent Technologies 4155B, 4156B manual

4156B, 4155B specifications

Agilent Technologies 4155B is a highly advanced semiconductor parameter analyzer designed to meet the rigorous demands of research and development in the semiconductor industry. As part of Agilent's renowned 4150 series, the 4155B stands out for its remarkable accuracy, versatility, and robust functionality.

One of the primary features of the Agilent 4155B is its ability to perform precise measurements on a wide range of devices, including MOSFETs, BJTs, diodes, and other semiconductor components. This capability is facilitated by its high-performance measurement technology, which employs fast and accurate analog-to-digital converters, enabling the analyzer to deliver quick and reliable results.

The 4155B offers a comprehensive array of measurement capabilities, including DC I-V characterization, CV, and pulse measurements. This flexibility allows researchers to analyze the electrical characteristics and performance of their devices in a variety of conditions, making it an essential tool for engineers and scientists working on semiconductor research.

One standout characteristic of the 4155B is its ability to handle multiple measurement channels. It can be configured with up to four independent measurement channels, allowing users to conduct simultaneous measurements across different devices. This feature significantly enhances productivity, as it minimizes the time spent on testing and increases throughput for wafer-level characterization.

Additionally, the Agilent 4155B boasts a complete suite of software options that enhance its usability. The intuitive user interface simplifies the configuration and navigation of the device, enabling users to set up tests and gather data quickly. The powerful data analysis capabilities built into the software allow for detailed evaluations, comparisons, and visualizations of measurement results, facilitating informed decision-making in development processes.

The integration of modular hardware design in the 4155B further enhances its adaptability. Users can equip the system with various source/measurement units (SMUs) and connections tailored to their specific testing requirements. This modular approach allows for easy upgrades, ensuring that the instrument can evolve alongside advancing technologies in the semiconductor field.

Overall, Agilent Technologies 4155B is an indispensable asset for semiconductor testing and analysis. With its high accuracy, extensive measurement capabilities, and flexibility, it empowers researchers to develop and optimize semiconductor devices with confidence and efficiency. This makes the 4155B a vital tool for driving innovation in the fast-paced world of semiconductor technology.