Intel X18-M, X25-M 3.5Reliability, 3.4.5Electromagnetic Immunity, 3.5.1Nonrecoverable Read Errors

Models: X25-M X18-M

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3.4.5Electromagnetic Immunity

Intel® X18-M/X25-M SATA SSD

3.4.5Electromagnetic Immunity

Electromagnetic Immunity tests assume the SSD is properly installed in the representative host system. The drive will operate properly without errors or degradation in performance when subjected to radio frequency (RF) environments defined in the following table:

Table 11.

Radio Frequency Specifications

 

 

 

 

 

 

 

Test

 

Description

Performance

Reference Standard

 

Criteria

 

 

 

 

 

 

 

 

Electrostatic discharge

Contact, HCP, VCP: ±8kV; Air: ± 15 kV

B

EN 61000-4-2: 95

 

 

 

 

 

 

 

80 to 1,000 MHz, 3 V/m,

 

 

Radiated RF immunity

80% AM with 1 kHz sine

A

EN 61000-4-3: 96

900 MHz, 3 V/m, 50% pulse modulation at

ENV 50204: 95

 

 

 

 

 

200 Hz

 

 

 

 

 

 

 

Electrical fast transient

± 1 kV on AC mains, ± 0.5 kV on external

B

EN 61000-4-4: 95

I/O

 

 

 

 

 

 

 

 

 

Surge immunity

 

± 1 kV differential, ± 2 kV common, AC

B

EN 61000-4-5: 95

 

mains

 

 

 

 

 

 

 

 

 

Conducted RF immunity

150 kHz to 80 MHz, 3 Vrms, 80% AM with 1

A

EN 61000-4-6: 97

kHz sine

 

 

 

 

 

 

 

 

 

 

 

0% open, 5 seconds

C

 

Voltage dips, interrupts

0% short, 5 seconds

C

EN 61000-4-11: 94

40%, 0.10 seconds

C

 

 

 

 

 

70%, 0.01 seconds

B

 

Notes:

1.Performance Criteria A = The device shall continue to operate as intended, i.e., normal unit operation with no degradation of performance.

2.Performance Criteria B = The device shall continue to operate as intended after completion of the test. However, during the test, some degradation of performance is allowed as long as there is no data loss operator intervention to restore device function.

3.Performance Criteria C = temporary loss of function is allowed. Operator intervention is acceptable to restore device function.

4.Contact electostatic discharge applied to drive enclosure.

3.5Reliability

Table 12.

Reliability Specifications

 

 

 

 

 

Parameter

Value

 

 

Nonrecoverable read errors

1 sector in 1015 bits read, max

Mean Time between Failure (MTBF)

1,200,000 hours

 

 

Power On/Off Cycles

50,000 cycles

 

 

Minimum Useful Life

5 years

 

 

 

3.5.1Nonrecoverable Read Errors

The nonrecoverable read error rate will not exceed one sector in the specified number of bits read. In the extremely unlikely event of a nonrecoverable read error, the drive will report it as a read failure to the host; the sector in error is considered corrupt and is not returned to the host.

Intel® X18-M/X25-M SATA Solid State Drive

 

Product Manual

February 2009

10

Order Number: 319765-006US

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Intel X18-M 3.5Reliability, 3.4.5Electromagnetic Immunity, 3.5.1Nonrecoverable Read Errors, Radio Frequency Specifications