Chapter 1 Introduction
NI PXI/PCI-1411 User Manual 1-4 ni.com
Vision Development Module
The Vision Development Module is an image acquisition, processing, and
analysis library of more than 270 functions for the following common
machine vision tasks:
• Pattern matching
• Particle analysis
•Gauging
• Taking measurements
• Grayscale, color, and binary image display
You can use the Vision Development Module functions individually or
in combination. With the Vision Development Module, you can acquire,
display, and store images, as well as perform image analysis, and
processing. Using the Vision Development Module, imaging novices and
experts can program the most basic or complicated image applications
without knowledge of particular algorithm implementations.
As a part of the Vision Development Module, NI Vision Assistant is an
interactive prototyping tool for machine vision and scientific imaging
developers. With Vision Assistant, you can prototype vision applications
quickly and test how various vision image processing functions work.
Vision Assistant generates a Builder file, which is a text description
containing a recipe of the machine vision and image processing functions.
This Builder file provides a guide you can use for developing applications
in any ADE, such as LabWindows/CVI or Visual Basic, using the Vision
Assistant machine vision and image processing libraries. Using the
LabVIEW VI creation wizard, Vision Assistant can create LabVIEW VI
block diagrams that perform the prototype you created in Vision Assistant.
You then can use LabVIEW to add functionality to the generated VI.
Integration with DAQ and Motion Control
Platforms that support NI-IMAQ also support NI-DAQ and a variety of
National Instruments DAQ devices. This allows integration between image
acquisition devices and National Instruments DAQ products.
Use National Instruments high-performance stepper and servo motion
control products with pattern matching software in inspection and guidance
applications, such as locating alignment markers on semiconductor wafers,
guiding robotic arms, inspecting the quality of manufactured parts, and
locating cells.