UIS OBJECTIVE LENSES
IR Long WD M Plan SemiApochromat/IR M Plan SemiApochromat
LMPlan-IR series/MPlan-IR
IR objective lenses which compensate for aberrations from visible to near infrared light.
Ideal for the observations of semiconductor interiors and the back surface of a chip package as well as CSP bump inspection.
| LMPlan5xIR |
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| LMPlan10xIR |
| ø20.32 |
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| ø20.32 |
4.5 |
| 4.5 |
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(25) | 22.5 | (26.5) | 25 | 23 |
45 |
| 45 |
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| ø21 |
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WD=20 | ø26 | WD=18.5 | ø12.4 |
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ø15 ø22 ø26
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| LMPlan50xIR |
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| LMPlan100xIR |
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| ø20.32 |
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| ø20.32 |
4.5 |
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| 4.7 |
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45 | (39) | 37.5 | 36.9 | 32.9 | 45 | (41.6) | 40.8 | 36.8 |
WD=6 | ø12.5 | WD=3.4 | ø12.5 |
ø18 | ø18.12 | ||
| ø15.6 |
| ø15 |
| ø26 |
| ø26 |
LMPlan20xIR
ø20.32
4.5 |
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45 | (36.9) | 34.3 | 30.3 |
WD=8.1 | ø10.4 |
ø18 | |
| ø26 |
MPlan100xIR
ø20.32
4.5 |
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45 | (44.7) | 43.4 | 42.6 | 37 |
WD=0.3 | ø4.95 |
ø14.8 | |
| ø12.2 |
| ø26 |
Unit: mm
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| UIS objective lenses |
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| Widefield eyepiece WHN10x | ||
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| Field Number 22 |
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Objective lens | Numerical | Working distance | Focal distance | Weight | Total | Practical field of | Depth of focus | |
(magnification) | Aperture | (mm) | f (mm) | (g) | magnifications | view (mm) | (µm) | |
LMPlan | 5xIR | 0.10 | 20.0 | 36 | 73 | 50 | 4.4 | 98 |
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LMPlan | 10xIR | 0.25 | 18.5 | 18 | 73 | 100 | 2.2 | 18 |
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LMPlan | 20xIR | 0.40 | 8.1 | 9 | 110 | 200 | 1.1 | 6.1 |
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LMPlan | 50xIR | 0.55 | 6.0 | 3.6 | 115 | 500 | 0.44 | 2.2 |
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LMPlan | 100xIR | 0.80 | 3.4 | 1.8 | 122 | 1000 | 0.22 | 0.87 |
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MPlan | 100xIR | 0.95 | 0.3 | 1.8 | 130 | 1000 | 0.22 | 0.67 |
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Screw: W20.32x0.706 (0.8"x1/36")
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