Philips AN1651 manual Vi. Multiple Stage Considerations, NE5234 THD Test Circuits

Models: AN1651

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Figure 9. NE5234 THD Test Circuits

Philips Semiconductors

Application note

 

 

 

Using the NE/SA5234 amplifier

AN1651

 

 

 

signal-to-noise ratio at the output of this stage is determined by first multiplying the gain times the signal which gives 1VRMS with a resultant noise of 400mVRMS. The signal-to-noise ratio is calculated as

￿

￿

* 4

)

+

68dB

(EQ. 5.)

S N

20log10 (1.0 4x10

 

 

 

S￿N 20 log

 

100x10* 3

￿

(EQ. 7.)

10

￿

 

 

1.6x10* 4

 

 

+56dB

A 56dB S/N will provide superior voice channel communications .

This is quite adequate for good quality audio applications.

Next assume that the bandwidth is cut to 3.0kHz with an input of

1mVRMS. The RMS noise is modified by the ratio of the root of the noise channel bandwidths.

 

￿3x103

 

 

￿

 

￿@ EN + 1.6VRMS

(EQ. 6.)

 

 

 

 

 

￿20x103

 

 

Amplified Noise = 160μVRMS

 

en 1.6μV

 

 

100kΩ

en

1mVRMS

+

+

±

±

 

 

RS = 100Ω

 

 

x100

 

x10

1mVRMS SIGNAL +1.6mVRMS NOISE

SL00636

Figure 8.

10k

 

+

VCC

1μF

 

 

 

 

100k

 

UNITY GAIN

 

 

 

VCC

 

3 +

 

2

 

 

1

2.2μF

2 ±

 

 

600Ω

 

 

 

 

 

 

RL = 600Ω

1μF

 

 

 

10k

10k

+ VCC

 

 

 

 

 

 

VCC

 

ST1700

 

 

 

2

 

 

3

+

1

4.7μF

 

1μF

2

±

 

 

 

 

 

 

 

 

600Ω

1k

 

 

10k

100pF

40dB CIRCUIT

 

 

 

 

ST1700

DISTORTION

ANALYZER

SL00637

Figure 9. NE5234 THD Test Circuits

VI. MULTIPLE STAGE CONSIDERATIONS

Since multiple noise generators are non-coherent, their total effect is the root-of-the-sum-of-the-squares of the various noise generators at a given amplifier input.

This makes orders-of-magnitude lower noise sources less important than the higher magnitude source. Therefore, when considering the combined signal-to-noise of multiple stages of gain, the first stage in a chain dominates making its design parameters the most critical.

For this reason it is good practice to make the preamp stage gain as high as practical to boost signal levels to the second stage allowing at least an order-of-magnitude above the second-stage noise. For

instance, a signal input which exceeds the input noise of the following stage by a factor of 10:1 will only be degraded by 0.5% or -46dB, neglecting the first-stage noise. If we use the preceding example with a first-stage output signal of 100mVRMS and a 56dB S/N, and an output noise of 0.16mV. Following this with a 10kHz band limited gain-of-10 second-stage, with a 100kΩ noise source at the non-inverting input, the combined S/N is calculated as follows: (assume a 100Ω source resistance from amplifier #1)

The Second stage output noise is:

1991 Oct

6

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Philips AN1651 manual Vi. Multiple Stage Considerations, NE5234 THD Test Circuits, Using the NE/SA5234 amplifier