Samsung 100737108-A , ,

device shall suspend off-line data collection activity after an interrupting command and resume off-line

data collection activity after some vendor-specified event.

 Bit 3 (off-line read scanning implemented bit) - If this bit is cleared to zero, the device does not support

off-line read scanning. If this bit is set to one, the device supports off-line read scanning

 Bit 4 (self-test implemented bit) – If this bit is cleared to zero, the device does not implement the Short

and Extended self-test routines. If this bit is set to one, the device implements the Short and Extended

self-test routines.

 Bit 7-5 (reserved).

The following describes the definition for the SMART capability bits. If the value of all of these bits is equal

to zero, then this device does not implement automatic saving o f SMART data.

 Bit 0 (power mode SMART data saving capability bit) – If the value of this bit equals one, the device

shall save its SMART data prior to going into a power saving mode (Idle, Standby, or Sleep) or

immediately upon return to Active or Idle mode from a Standby mode. If the value of this bit equals zero,

the device shall not save its SMART date prior to going into a power saving mode (Idle, Standb y, or

Sleep) or immediately upon return to Active or Idle mode from a Standby mode.

 Bit 1 (SMART data auto-save after event capability bit) – The value of this bit shall be equal to one fo r

devices complying with this standard.

 Bits 2-15 (reserved).

Self-test routine recommended polling time

The self-test routine recommended polling time shall be equal to the number of minutes that is the minimu m

recommended time before which the host should first poll for test completion status. Actual test time could be

several times this value. Polling before this time could extend the self-test execution time or abort the test

depending on the state of bit 2 of the off-line data capabilit y bits.

The data structure checksum is the two’s compliment of the result of a simple eight-bit addition of the first 511

bytes in the data structure.

8.2.34.6 SMART read log sector (D5h)

This command returns the indicated log sectors to the host.

8.2.34.7 SMART return status (DAh)

This command is used to co mmunicate the reliability status of the device to the host at the host’s request. If a

threshold exceeded condition is not detected by t he device, the device shall set the Cylinder Low register to

4Fh and the Cylinder High register to C2h. If the device det ects a threshold-exceeded condition, the device

shall set Cylinder Low register to F4h and Cylinder High re gister to 2Ch

8.2.34.8 SMART w rite log sector (D6h)

This command writes number of 512-byte data sectors to the indicated log sector.