SanDisk 5000 2.5 manual General Information, Deviations, Accreditation Statements

360 Herndon Parkway Suite 1400 Herndon, VA 20170 http://www.rheintech.com

1 GENERAL INFORMATION

The following test report for a Class B digital device is prepared on behalf of SanDisk Corporation in accordance with Part 2, and Part 15, Subparts A and B of the Federal Communications Commissions Rules and Regulations. The Equipment Under Test (EUT) was the SanDisk SSD SATA 5000 2.5”. The test results reported in this document relate only to the items that were tested.

All measurements contained in this Application were conducted in accordance with ANSI C63.4 Methods of Measurement of Radio Noise Emissions, 2003. The instrumentation utilized for the measurements conforms to the ANSI C63.4 standard for EMI and Field Strength Instrumentation. Some accessories are used to increase sensitivity and prevent overloading of the measuring instrument. Calibration checks are performed regularly on all test equipment.

All radiated and conducted emission measurements were performed manually at Rhein Tech Laboratories, Inc. The radiated emissions measurements were performed on the (three/ten) meter, open field, test range maintained by Rhein Tech Laboratories, Inc., 360 Herndon Parkway, Suite 1400, Herndon, Va., 20170. Complete description and site attenuation measurement data has been placed on file with the Federal Communications Commission. The power line conducted emission measurements were performed in a shielded enclosure also located at the Herndon, Virginia facility. Rhein Tech Laboratories is accepted by the FCC as a facility available to do measurement work for others on a contract basis.

1.1DEVIATIONS

There were no deviations from the test standard(s) and/or methods.

1.2ACCREDITATION STATEMENTS

•NVLAP (USA): Accreditation under NVLAP Lab Code: 200061-0

•US CAB: Recognition as of U.S. Conformity Assessment Body (CAB) for EMC testing under US-EU and US-APEC MRA; IC accepted CAB under Phase I of APEC Telecommunication MRA. Identification number US0079.

•FCC (USA): Listing of test sites, Registration # 90902

•IC (Canada): Listing of test sites, IC 2956-1 and IC 2956-2

•US TCB (ATCB): Certification of cooperation, granted in 2005

•CE Notified Body: Rhein Tech Laboratories, Inc. has been approved by TNO Certification B.V. to provide EMC Test Reports and Technical Construction Files to TNO Certification B.V. Rheintech Certification number: 10118957

•AUSTEL (Australia): Acceptance as of a Listed Test House, A97/TH/0107

•ANATEL (Brazil, telecommunication): NCC certification for performing tests

•Ministry of Commerce (New Zealand): Approval of a test laboratory: ECR 3-9 BAE

•VCCI (Japan): Approval and registration of RTL test sites as R-1113 and C-1172

SanDisk Corporation	Page 4 of 17
DoC Report
2006137
04/27/07