SanDisk uSSD 5000 | Product Manual |
2.6System Reliability
Table 5: Reliability
Specification | Parameters |
|
|
Data Reliability | Error detection / error correction based on |
| BCH algorithm |
|
|
Data integrity after power loss | Data is guaranteed after power loss |
|
|
Bad blocks | Transparent bad block management |
|
|
Dynamic and Static | |
|
|
2.6.1 MTTF
The reliability figure of merit most often used for electronic equipment is Mean Time To Failure (MTTF). SanDisk estimates MTTF using a prediction methodology based on reliability data for the individual components in SanDisk products.
Component data comes from several sources: device life tests, failure analysis of earlier equipment, device physics, and field returns.
SanDisk uses following methods to predict reliability:
Telcordia Special Report
British Telecom Industry HRD5, Handbook of Reliability Data for Electronic Components used in Telecommunication System.
Table 6 summarizes the MTTF prediction results for various uSSD configurations. The analysis was performed using a RAM Commander™ failure rate prediction.
Failure Rate: The total number of failures within an item population, divided by the total number of life units expended by that population, during a particular measurement interval under stated condition.
Mean Time To Failures (MTTF): A basic measure of reliability for repairable items: The mean number of life units during which all parts of the item perform within their specified limits, during a particular measurement interval under stated conditions.
Table 6: uSSD MTTF
Product | Condition | MTTF (Hours) |
|
|
|
1GB, 2GB, 4GB | Telcordia | 10M |
|
|
|
8GB, 16GB | Telcordia | 8M |
|
|
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© 2008 SanDisk® Corporation | 9 | October 2008, Document no. |
