SanDisk 80-36-03353 manual System Reliability, USSD Mttf, Product Condition Mttf Hours

SanDisk uSSD 5000 Product Manual

2.6System Reliability

Table 5: Reliability

Specification	Parameters
Data Reliability	Error detection / error correction based on
	BCH algorithm
Data integrity after power loss	Data is guaranteed after power loss
Bad blocks	Transparent bad block management
Wear-leveling	Dynamic and Static Wear-leveling

2.6.1 MTTF

The reliability figure of merit most often used for electronic equipment is Mean Time To Failure (MTTF). SanDisk estimates MTTF using a prediction methodology based on reliability data for the individual components in SanDisk products.

Component data comes from several sources: device life tests, failure analysis of earlier equipment, device physics, and field returns.

SanDisk uses following methods to predict reliability:

Telcordia Special Report SR-332, Reliability Prediction Procedure for Electronic Equipment (RPP).

British Telecom Industry HRD5, Handbook of Reliability Data for Electronic Components used in Telecommunication System.

Table 6 summarizes the MTTF prediction results for various uSSD configurations. The analysis was performed using a RAM Commander™ failure rate prediction.

Failure Rate: The total number of failures within an item population, divided by the total number of life units expended by that population, during a particular measurement interval under stated condition.

Mean Time To Failures (MTTF): A basic measure of reliability for repairable items: The mean number of life units during which all parts of the item perform within their specified limits, during a particular measurement interval under stated conditions.

Table 6: uSSD MTTF

Product	Condition	MTTF (Hours)
1GB, 2GB, 4GB	Telcordia SR-332, GB, 25°C	10M
8GB, 16GB	Telcordia SR-332, GB, 25°C	8M

© 2008 SanDisk® Corporation 9 October 2008, Document no. 80-36-03353