Seagate ST800FM0032 manual Reliability Specifications, Unrecoverable Errors, Interface errors

Models: ST800FM0002 ST100FM0002 ST200FM0002 ST400FM0012 ST800FM0032 ST200FM0042 ST200FM0012 ST100FM0052 ST400FM0002 ST400FM0042 ST800FM0012 ST100FM0012

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5.0RELIABILITY SPECIFICATIONS

The following reliability specifications assume correct host and drive operational interface, including all interface timings, power supply voltages, environmental requirements and drive mounting constraints.

Read Error Rates 1

 

 

Unrecovered Data

Less than 1 LBA in 1016 bits transferred

 

Miscorrected Data

Less than 1 LBA in 1021 bits transferred

 

Interface error rate:

Less than 1 error in 1012 bits transferred

 

Mean Time Between Failure (MTBF):

2,000,000 hours

 

Annualized Failure Rate (AFR):

0.44%

 

Preventive maintenance:

None required

 

Typical Data Retention with

3 months

 

Power removed (at 40C) 2

 

 

Endurance Rating: 3

Method 1: Full drive writes per day 10

 

 

Method 2: TBW (per JEDEC JESD218 800GB = 17,800 TB

 

400GB =

8800 TB

 

200GB =

4400 TB

 

100GB =

2200 TB

1.Error rate specified with automatic retries and data correction with ECC enabled and all flaws reallocated.

2.As NAND Flash devices age with use, the capability of the media to retain a programmed value begins to deteriorate. This deterioration is affected by the number of times a particular memory cell is programmed and subsequently erased. When a device is new, it has a powered off data retention capability of up to several years. With use the retention ca- pability of the device is reduced. Temperature also has an effect on how long a Flash component can retain its pro- grammed value with power removed. At high temperature the retention capabilities of the device are reduced. Data retention is not an issue with power applied to the SSD. The SSD drive contains firmware and hardware features that can monitor and refresh memory cells when power is applied.

3.Endurance rating is the expected amount of host data that can be written by product when subjected to a specified work- load at a specified operating and storage temperature. For the specific workload to achieve this level of endurance, please reference JEDEC Specification JESD218. TBW is defined as 1x10^12 Bytes.

5.1ERROR RATES

The error rates stated in this manual assume the following:

The drive is operated in accordance with this manual using DC power as defined in paragraph 6.3, "DC power requirements."

Errors caused by host system failures are excluded from error rate computations.

Assume random data.

Default OEM error recovery settings are applied. This includes AWRE, ARRE, full read retries, full write retries and full retry time.

5.1.1Unrecoverable Errors

An unrecoverable data error is defined as a failure of the drive to recover data from the media. These errors occur due to read or write problems. Unrecoverable data errors are only detected during read operations, but not caused by the read. If an unrecoverable data error is detected, a MEDIUM ERROR (03h) in the Sense Key will be reported. Multiple unrecoverable data errors resulting from the same cause are treated as 1 error.

5.1.2Interface errors

An interface error is defined as a failure of the receiver on a port to recover the data as transmitted by the device port connected to the receiver. The error may be detected as a running disparity error, illegal code, loss of word sync, or CRC error.

PULSAR.2 SAS PRODUCT MANUAL, REV. C

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Seagate ST800FM0032, ST100FM0012, ST100FM0052 manual Reliability Specifications, Unrecoverable Errors, Interface errors