Solid State Logic XR622 Performance Specification, F.5.1, Measurement Conditions, F.5.2, Page F-5

Models: XR622

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Performance Specification

 

 

 

 

X-Rack Master Module

F.5

Performance Specification

 

 

 

 

 

 

The following page contains audio performance specification figures for the X-Rack Master module. No

 

other Solid State Logic products are covered by this document and the performance of other Solid State

F.5.1

Logic products can not be inferred from the data contained herein.

Measurement Conditions

 

 

 

For each set of figures on the following pages, the specific unit and test setup will be stated at the

 

beginning of that section. Any changes to the specified setup for any particular figure(s) will be detailed

F.5.2

beside the figures to which that difference applies.

Measurement References

 

 

 

Unless otherwise specified the references used in this specification are as follows:

 

Reference frequency:

1kHz

 

Reference level:

0dBu, where 0dBu ≈ 0.775V into any load

 

• Source impedance of Test Set:

50Ω

Input impedance of Test Set: 100kΩ

All unweighted measurements are specified as 22Hz to 22kHz band limited RMS and are expressed in units of dBu

All distortion measurements are specified with a 36dB/Octave low pass filter at 80kHz and are expressed as a percentage

The onset of clipping (for headroom measurements) should be taken as 1% THD

Unless otherwise quoted all figures have a tolerance of ±0.5dB or 5%

All measurements are made with the operating level switch set for +4dBu

F.5.3 Mix Bus Performance

 

Signal applied to one channel of an X-Rack Line Input module and routed to Mix Bus. Signal measured

on Mix Output. All other inputs un-routed from the bus under test. Mix Bus Gain control set to 0dB.

Gain

Continuously variable from –∞ to 0dB

THD + Noise

< 0.005% from 20Hz to 10kHz,

(+24dBu applied, 0dB gain)

< 0.008% at 20kHz

Frequency Response

±0.1dB from 20Hz to 20kHz

Equivalent Input Noise

–3dB at 150kHz

< –88dBu

(Input terminated with 150Ω)

 

F.5.4 Record Bus Performance

 

Signal applied to one channel of an X-Rack Line Input module and routed to Record Bus. Signal measured

on Record Output. All other inputs un-routed from the bus under test.

THD + Noise

< 0.005% from 20Hz to 20kHz

(+24dBu applied, 0dB gain)

±0.1dB from 20Hz to 20kHz

Frequency Response

Equivalent Input Noise

–3dB at 150kHz

< –88dBu

(Input terminated with 150Ω)

 

Page F-5

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Solid State Logic XR622 Performance Specification, F.5.1, Measurement Conditions, F.5.2, Measurement References, Page F-5