TC9457F
2002-10-21
12
I/O Ports (P1-0 to P4-3)
Characteristics Symbol
Test
Circuit Test Condition Min Typ. Max Unit
High level IOH3 V
OH = 4.5 V 1 2
IOL3 VOL = 0.5 V
(exclude P4-1, 2, 3 pin) 1.5 3.0
Output current
Low level
IOL5 V
OL = 0.5 V (P4-1, 2, 3 pin) 4 10
mA
Input leakage current ILI V
IH = 5.0 V, VIL = 0 V ±1.0 µA
High level VIH MVDD
× 0.8 ~ MVDD
Input voltage
Low level VIL 0 ~
MVDD
× 0.2
V
Input pullup/down resistance RIN1 (P1-0 to P1-3) When pulldown,
pullup are set. 25 50 120 k

HOLD, INTR Input Port, RESET Input

Characteristics Symbol
Test
Circuit Test Condition Min Typ. Max Unit
Input leakage current ILI V
IH = 5.0 V, VIL = 0 V ±1.0 µA
High level VIH3 MVDD
× 0.8 ~ MVDD
Input voltage
Low level VIL 3 0 ~
MVDD
× 0.2
V

A/D Converter (ADIN1 to ADIN4)
Characteristics Symbol
Test
Circuit Test Condition Min Typ. Max Unit
Analog input voltage range VAD ADIN to ADIN4 0 ~ MVDD V
Resolution VRES 6 bit
Overall conversion error ±0.5 ±4.0 LSB
Analog input leakage ILI VIH = 5.0 V, VIL = 0 V
(ADIN1 to ADIN4) ±1.0 µA

DATA, SFSY, LRCK, BCK, AOUT, MBOV, IPF Outputs and CLCK Input/Output
Characteristics Symbol
Test
Circuit Test Condition Min Typ. Max Unit
High level IOH4
VOH = 4.5 V
(Settings OT for output,
LEDon = 0)
2.0 4.0
Output current
Low level IOL5
VOL = 0.5 V
(Settings OT for output,
LEDon = 0)
5 10
mA
Input leakage current ILI VIH = 5.0 V, VIL = 0 V
(CLCK) ±1.0 µA
High level VIH (CLCK) MVDD
× 0.8 ~ MVDD
Input voltage
Low level VIL (CLCK) 0 ~ MVDD
× 0.2
V