Cypress STK15C88 manual Data Retention and Endurance, Capacitance, AC Test Conditions

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STK15C88

Data Retention and Endurance

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

 

 

 

Description

 

Min

 

 

 

Unit

 

DATAR

 

 

 

Data Retention

 

 

 

 

100

 

 

 

 

Years

NVC

 

 

 

Nonvolatile STORE Operations

 

1,000

 

 

 

K

 

Capacitance

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

In the following table, the capacitance parameters are listed.[4]

 

 

 

 

 

 

 

 

Parameter

 

 

 

Description

 

Test Conditions

 

 

Max

 

 

Unit

 

CIN

 

 

Input Capacitance

 

 

TA = 25°C, f = 1 MHz,

 

 

5

 

 

pF

 

 

 

 

 

 

 

VCC = 0 to 3.0 V

 

 

 

 

 

 

 

 

COUT

 

 

Output Capacitance

 

 

 

7

 

 

pF

 

Thermal Resistance

 

 

 

 

 

 

 

 

 

 

 

 

 

In the following table, the thermal resistance parameters are listed.[4]

 

 

 

 

 

 

 

 

Parameter

 

Description

 

 

Test Conditions

 

 

28-SOIC

28-SOIC

 

Unit

 

 

 

 

 

(300 mil)

(330 mil)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ΘJA

Thermal Resistance

Test conditions follow standard test methods and

 

TBD

 

 

TBD

 

°C/W

 

(Junction to Ambient)

procedures for measuring thermal impedance,

 

 

 

 

 

 

 

 

 

per EIA / JESD51.

 

 

 

 

 

 

 

 

ΘJC

Thermal Resistance

 

 

TBD

 

 

TBD

 

°C/W

 

(Junction to Case)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Figure 4. AC Test Loads

 

 

 

 

 

 

 

 

R1 480Ω

5.0V

Output

30 pF

 

 

 

 

 

 

 

 

 

 

 

 

R2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

255Ω

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

AC Test Conditions

Input Pulse Levels

0 V to 3

V

Input Rise and Fall Times (10% - 90%)

<5 ns

Input and Output Timing Reference Levels

1.5

V

Note

4. These parameters are guaranteed by design and are not tested.

Document Number: 001-50593 Rev. **

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Contents Cypress Semiconductor Corporation 198 Champion Court FeaturesLogic Block Diagram Functional DescriptionPower Supply Inputs to the Device Pin ConfigurationsWrite Enable Input, Active LOW. When the chip is enabled Output Enable, Active LOW. The active LOWSram Write Hardware Recall Power UpDevice Operation Sram ReadBest Practices Low Average Active PowerHardware Protect Noise ConsiderationsRead Sram Output Data 0x303F Software STORE/RECALL Mode Selection 13 a0x0E38 Read Sram Output Data Read Sram Output Data 0x03E0Operating Range DC Electrical CharacteristicsRange Ambient Temperature Maximum RatingsThermal Resistance Data Retention and EnduranceCapacitance AC Test ConditionsParameter Description 25 ns 45 ns Unit Cypress Alt Min Max AC Switching CharacteristicsSwitching Waveforms Sram Read CycleMin Max Parameter SwitchingParameter Alt Description STK15C88 Unit Min Max AutoStore or Power Up RecallParameter Alt Description 25 ns 45 ns Unit Min Max Software Controlled STORE/RECALL CycleOrdering Information Part Numbering Nomenclature STK15C88 N F 45 I TRPin 300 mil Soic Package DiagramsPin 330 mil Soic Document History Sales, Solutions and Legal InformationWorldwide Sales and Design Support Products PSoC Solutions New data sheet
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