Cypress STK14C88-3 manual Data Retention and Endurance, Capacitance, Thermal Resistance

							STK14C88-3
Data Retention and Endurance
Parameter			Description		Min			Unit
DATAR		Data Retention			100			Years
NVC		Nonvolatile STORE Operations			1,000			K
Capacitance
In the following table, the capacitance parameters are listed.[8]
Parameter			Description	Test Conditions		Max		Unit
CIN	Input Capacitance			TA = 25°C, f = 1 MHz,		5		pF
				VCC = 0 to 3.0 V
COUT	Output Capacitance					7		pF

Thermal Resistance

In the following table, the thermal resistance parameters are listed.[8]

Parameter	Description	Test Conditions	32-SOIC	32-PDIP	Unit
ΘJA	Thermal Resistance	Test conditions follow standard test methods and	TBD	TBD	°C/W
	(Junction to Ambient)	procedures for measuring thermal impedance, per
		EIA / JESD51.
ΘJC	Thermal Resistance		TBD	TBD	°C/W
	(Junction to Case)
		Figure 6. AC Test Loads

R1 317Ω

3.3V

Output

30 pF R2

351Ω

AC Test Conditions

Input Pulse Levels	0 V to 3	V
Input Rise and Fall Times (10% - 90%)	<5 ns
Input and Output Timing Reference Levels	1.5	V

Note

8. These parameters are guaranteed by design and are not tested.

Document Number: 001-50592 Rev. ** Page 8 of 17

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