Agilent Technologies 8510 manual ΠfX, ΠfZ

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It is not possible to remove fringing capacitance, but the resultant phase shift can be modeled as a function of frequency using C0 through C3 (C0 +Cl x f + C2 x f2 + C3 x f3,with units of F(Hz), C0(fF), C1(10-27F/Hz), C2(10-36F/Hz2) and C3(10-45F/Hz3), which are the coefficients for a cubic polynomial that best fits the actual capacitance of the “open.”

A number of methods can be used to determine the fringing capacitance of an “open.” Three tech- niques, described here, involve a calibrated reflec- tion coefficient measurement of an open standard and subsequent calculation of the effective capaci- tance. The value of fringing capacitance can be cal- culated from the measured phase or reactance as a function of frequency as follows.

Ceff =

tan(

∆∅

)

=

1

2

 

 

 

2πfX

 

2πfZ0

Ceff – effective capacitance ∆∅ – measured phase shift f – measurement frequency F – farad

Z0 – characteristic impedance X – measured reactance

This equation assumes a zero-length open. When using an offset open the offset delay must be backed-out of the measured phase shift to obtain good C0 through C3 coefficients.

This capacitance can then be modeled by choosing coefficients to best fit the measured response when measured by either method 3 or 4 below.

1.Fully calibrated 1-Port–Establish a calibrated reference plane using three independent standards (that is, 2 sets of banded offset shorts and load). Measure the phase response of the open and solve for the capacitance function.

2.TRL 2-PORT–When transmission lines standards are available, this method can be used for a com- plete 2-port calibration. With error-correction applied the capacitance of the open can be meas- ured directly.

3.Gating–Use time domain gating to correct the measured response of the open by isolating the reflection due to the open from the source match reflection and signal path leakage (directivity). Figure 3 shows the time domain response of the open at the end of an airline. Measure the gated phase response of the open at the end of an airline and again solve for the capacitance function.

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Contents Dis Product Information For Support Reference Only Table of contents Introduction Measurement errorsMeasurement calibration Calibration kit Standard definition Class assignmentStandard definitions table Standard class assignments Modification procedure Select standardsDefine standards Standard definition modelsStandard type Standard numberOpen circuit capacitance C0 , C1 , C2 and C3 ΠfX ΠfZ∆∅radians = 2πf ∆length Short circuit inductance L0 , L1, L2 and L3Fixed or sliding Offset delayTerminal impedance Linear delay Actual delay = Fco/f2 Offset Z0Log e10 Offset lossGHz C Z 1GHzLower/minimum frequency Coax or waveguide ∅radians = 2π = 2πfdelayUpper/maximum frequency Λg = λ Co2Standard labels Assign classesStandard Classes Reverse transmission match and thru S11 A,B,C and S22 A,B,CForward transmission match and thru IsolationTRL Line TRL ThruTRL Reflect TRM ThruTRL options Standard Class labelsCalibration kit label Enter standards/classes Verify performanceModeling a thru adapter User modified cal kits and Agilent 8510 specificationsModification examples Modeling an arbitrary impedance standardTo load calibration kits from disk into Agilent Appendix a Calibration kit entry procedureDisk procedure To store calibration kits from the Agilent 8510 onto a diskFront panel procedure P-band waveguide example Pshort Mm coaxial connector interface Appendix B Dimensional considerations in coaxial connectorsType-N coaxial connector interface Female type-N Page Appendix C Cal coefficients model EquationTheir first order approximations, R is small and G=0, are Then Agilent Direct Agilent Email UpdatesAgilent Open