Test Sets, Family of test sets | Agilent Technologies 8510XF

Test Sets

The test set in a VNA measurement system is used to separate the inci- dent, the reflected, and the transmitted signals. It is also used to convert the RF signal to IF (intermediate fre- quency) signal and to pass the IF to the receiver.

Once signals are separated, their individual magnitude and phase differences can be measured. Test sets are classified into two groups: (1) one-path transmission or reflection and (2) two-path S-parameter allow- ing forward and reverse measure- ments of a two port device with a single connection. S-parameter test sets can be divided into two types: (1) sampler- based and (2) mixer-based, shown in Table 3. Sampler-based test sets require one external source to provide the RF stimulus. The mixer- based test sets require two external sources; one to provide the RF stimu- lus and the other to provide the LO signal.

Table 3. Family of test sets

Products	Frequency	Test set	Recommend	Recommend		Test port
	range (GHz)	(application)	RF source1	LO source1		connector2
	type	needed	needed	(GHz)		(GHz)

8511A3	0.045 to 26.5	Frequency	N/A	N/A		3.5 mm (M)
		Converter

8511B3	0.045 to 50	Frequency	N/A	N/A		2.4 mm (F)
		Converter

8512A	0.400 to 18	Transmission/		Obsolete
		Reflection

8513A	0.045 to 26.5	Transmission/		Obsolete
		Reflection

8514A	0.500 to 18	S-parameter		Obsolete

8514B	0.045 to 20	S-parameter	83621B	-----		3.5 mm (M)
		Sampler-based				(0.045 to 20)

8515A	0.045 to 26.5	S-parameter	83631B	-----		3.5 mm (M)
		Sampler-based	(0.045 to 26.5)	-----

8516A	0.045 to 40	S-parameter	Obsolete --- replaced with		8517A

8517A	0.045 to 50	S-parameter	Obsolete --- replaced with		8517B

8517B	0.045 to 50	S-parameter	83651B	-----		2.4 mm (M)
		Sampler-based	(0.045 to 50)

85110L	0.045 to 2	Pulsed-RF	83620B	83620B		7 mm
		S-parameter	#001, 004,	#004, 008,
		Mixer-based	008, H80	H80

85110A	2 to 20	Pulsed-RF	83622B	83623L		3.5 mm (M)
		S-parameter	#001, 004, 008	#004, 008
		Mixer-based	[Option H50:
			83650B
			(0.045 to 50)
			#001, 004, 008]

85105A4	33 to 110	S-parameter	83621B	83621B		WR-22 (33 to 50)
MM-wave	(waveguide	Mixer-based	(0.045 to 20)	(0.045 to 20)		WR-19 (40 to 60)
Controller	bands)	(waveguide	[Option 050:			WR-15 (50 to 75)
		bands)	83651B			WR-10 (75 to 110)
			(0.045 to 50)]

8510XF	0.045 to 110	S-parameter	83651B	83621B		1 mm (M)
MM-wave	(coaxial)	Mixer-based	(0.045 to 50)	(0.045 to 20)
Subsystem		(ultra-
		broadband)

1.Although general purpose 8360 series synthesized sweepers (836x0B) can be used in place of the 8510-dedicated 8360 series synthesized sweepers (836x1B), the following options are typically recommended: Option 004 (rear panel connectors) and Option 008 (1-Hz frequency resolution). These options are standard in the 8510-dedicated 8360 series synthesized sweepers.

Mixed sources: While mixing synthesized series is acceptable in multiple-source applications, the following areas must be considered:

•RF source = 8340, LO source = 8340, system performance will be degraded substantially.

•RF source = 8340, LO source = 8360, better system performance

•RF source = 8360, LO source = 8360, faster step frequency measurements. Using the 8340 as either the RF source or the LO source will more than double the measurement time.

2.All coaxial test port connectors are ruggedized connectors.

3.These test sets provide access to four samplers directly.

4.The following test set modules are available. Two test set modules must be ordered for complete waveguide S-parameter test set operation for each waveguide band:

•Q85104A test set module (33 GHz to 50 GHz)

•U85104A test set module (40 GHz to 60 GHz)

•V85104A test set module (50 GHz to 75 GHz)

•W85104A test set module (75 GHz to 110 GHz)