HP 6573Z (US) manual Electromagnetic susceptibility, Reliability, Electromagnetic compatibility

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U8 Family Product Manual, Rev. B

1.10 Electromagnetic susceptibility

The drive operates without errors when subjected to the following:

Radiated noise

3 volt/meter, 30 Hz to 500 MHz

Electrostatic discharge*

10 KVolts

Magnetic field strength

5 Gauss

*Electrostatic discharge susceptibility is measured with the drive mounted in a representative computer system (mounted to a ground plane with an earth ground). Discharges are applied to the bezel or other external surfaces on the ground plane.

1.11 Reliability

Nonrecoverable read errors

1 per 1013 bits read, max

Mean time between failures

500,000 power-on hours

 

(nominal power, 25°C ambient tem-

 

perature)

Contact start-stop cycles

50,000 cycles

 

(at nominal voltage and temperature,

 

with 60 cycles per hour and a 50%

 

duty cycle)

Preventive maintenance

None required

1.12 Agency certification

1.12.1 Safety certification

The drives are recognized in accordance with UL 1950 and CSA C22.2

(950)and meet all applicable sections of IEC950 and EN 60950 as tested by TUV North America.

1.12.2 Electromagnetic compatibility

Hard drives that display the CE marking comply with European Union requirements specified in Electromagnetic Compatibility Directives. Testing is performed to standards EN 50082-1 and EN 55022-B.

Seagate uses an independent laboratory to confirm compliance with the EC directives specified in the previous paragraph. Drives are tested in representative end-user systems. Although CE-marked Seagate drives

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Contents ST317221A, ST313021A U8 FamilyST38410A, ST34313A Ultra ATA Interface DrivesST317221A, ST313021A U8 FamilyST38410A, ST34313A Ultra ATA Interface DrivesPage U8 Family Product Manual, Rev. B ContentsATA interface Configuring and mounting the driveFigures U8 Family Product Manual, Rev. B Introduction Drive Specification Specification summary tableST317221A ST313021A0 to 60C op., -40 to 70C nonop ST317221AST317221A 1.1.1 Default logical geometry 1.0 Drive specifications1.1 Formatted capacity 1.2 Physical organizationDrive Specification 1.4 Physical characteristics1.3 Recording and interface technology 1.5 Seek time1.7.1 Power consumption 1.7 Power specificationsSpinup power 1.6 Start/stop timesOperating power and current Read/Write power and currentIdle mode power Seek Mode1.7.1.1 Typical current profile Power ModeTypical Watts Typical Amps RMSPower Modes 1.7.4 Power-management modes1.7.2 Conducted noise 1.7.3 Voltage tolerance1.8 Environmental tolerances 1.8.1 Ambient temperature Idle and Standby timers1.8.2 Temperature gradient Sleep mode1.8.3 Humidity 1.8.6.1 Operating vibration 1.8.6.2 Nonoperating vibration1.9 Drive acoustics 1.10 Electromagnetic susceptibility 1.12 Agency certification 1.12.1 Safety certification1.11 Reliability 1.12.2 Electromagnetic compatibilityAustralian CE-Tick N176 1.12.3 FCC verificationU8 Family Product Manual, Rev. B 2.1 Handling and static-discharge precautions 2.0 Configuring and mounting the drive7 5 3 8 6 4 2.2 Jumper settings 2.2.1 Master/slave configurationOptions jumper block J8 Master or single drive Drive is slave Cable select2.2.2 Cable-select option 2.2.3 Ultra ATA/66 cable2.3 Drive mounting Note Dimensions are shown in inches mm Figure 3. Mounting dimensions-top, side and end view3.1 ATA interface signals and connector pins 3.0 ATA interfaceSignal name Figure 4. I/O pins and supported ATA signalsHost pin # and signal description Drive pin #Command name 3.1.1 Supported ATA commandsCommand code in hex ATA-standard commandsCommand code in hex 3.1.2 Identify Drive commandDescription Wordx.xx Valuexx07H xxxxHxx1FH xxA5H Description if bit is set to Bit WordBit Word Set transfer mode based on value in Sector Count register 3.1.3 Set Features commandCode in Features 3.1.4 S.M.A.R.T. commandsS.M.A.R.T. Command RegisterCode in Features Page Page Seagate Technology, Inc 920 Disc Drive, Scotts Valley, California 95066, USAPublication Number SG35226-001, Rev. B, Printed in USA
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6573Z (US) specifications

The HP 8566C, 6573Z, 6647, 6671, and 6641 are examples of cutting-edge test equipment from Hewlett-Packard, now known as Agilent Technologies. Each of these models serves essential functions within the realm of RF and microwave signal analysis, tailored to meet the demands of engineers and technicians in various industries, including telecommunications, aerospace, and electronics.

The HP 8566C is a signal analyzer that provides comprehensive analysis, particularly useful for multi-channel and high-frequency signals. A notable feature of this model is its frequency range, which spans from 0.1 Hz to 26.5 GHz, making it suitable for a wide variety of applications. The instrument's advanced capabilities such as phase noise measurement, frequency response analysis, and spectrogram displays cater to precise and complex signal characterizations. The built-in tracking generator further enhances its utility, enabling users to test filters, amplifiers, and antenna systems efficiently.

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The HP 6647 and 6671 models are versatile electronic loads, primarily designed for battery testing and power supply validation. They support various testing modes, including constant current, constant voltage, and constant resistance modes, which provide flexibility for power electronics engineers. Their robust measurement capabilities allow for detailed analysis of response characteristics, load transients, and efficiency metrics.

Lastly, the HP 6641 complements this lineup by offering high-performance test equipment with similar applications in power electronics. It features intuitive interfaces and advanced programming capabilities, enabling streamlined automation of test procedures.

In conclusion, the HP 8566C, 6573Z, 6647, 6671, and 6641 collectively embody sophisticated testing capabilities in signal analysis and power electronics. Their features, ranging from high-frequency performance to accuracy in power delivery, make them indispensable in the modern technological landscape. These instruments support continuous innovation while ensuring the reliability of devices that are critical to both consumer and industrial sectors.