Furuno 1932 MARK-2 Self Test, 5.5Life Expectancy of Magnetron, 1Self test screen, 2Test pattern

5.4 Self Test

The self test facility checks the keyboard, ROM and RAM for proper operation.

1.Press the [MENU] key.

2.Select “OTHER MENU”.

3.Select “23. Self Test” and press the [ACQ/ ENTER] key. The following display appears.

		[Self Test]
	Key tset: Press each key and
	check on-screen indication
	lights.
ARP-10 TEST
ROM	OK 18990871xx
RAM	OK
SPEED	OK NAV 0.0KT
COURSE OK		167.6θ
TRIGGER NG
VIDEO	NG
BP	OK
HP	OK
MIN-HIT		0003
SCAN-TIME		0854
MAN-ACQ		00
AUTO-ACQ		00
FE-DATA1		0000
FE-DATA2		0000

Program No. : 0359222-XX.XX

ROM : OK

RAM : OK

EEPROM : OK

Hours in use : 000006.9H

Tx hours: 000001.1H

OK

<Press MENU for OTHERS menu>

XX: Program Version No.

Figure 5-1 Self test screen

4.The ROM and RAM are automatically checked. If NG (No Good) appears to the right of ROM or RAM indication, contact your dealer for advice. ARP-10 TEST results appear only when optional ARP-10 board is mounted.

5.To check the keyboard. Press any key except the omnipad, ACQ.and power keys. Its corresponding location on the display lights in black if the key is operating properly.

6.Press the [ACQ] key to check the display circuit. The following pattern should appear.

Figure 5-2 Test pattern

7.Press the [MENU] key to show the brilliance adjustment menu.

8.To escape from the selftest, press the [MENU] key.

5.5Life Expectancy of Magnetron

The following table shows the life expectancy of the magnetrons.

Table 5-3 Life expectancy of magnetrons

Model	Type	Code no.	Life
			expectancy
	E3571	000-146-867
1932 M2	MG4004	000-158-895
	MAF1421B	000-158-786	2,000-3,000
		-10
			hours
		000-146-871	(Including
	MAF1422B		stand-by)
		000-158-788
1942 M2
		-10
	MG4006	000-150-838

5-3