Kimber Kable PowerKordsTM manual S t s & M e a s u r e m e n t s

T e s t s & M e a s u r e m e n t s

Over twenty five years of manufacturing, research and engineering have led KIMBER KABLE

to explore in great detail the physical and electrical properties that influence signals and the

correlation to sensory quality. Through our OSCaR™ (objective Subjective, Correlation and

Results) engineering process KIMBER KABLE has developed many new proprietary proce-

dures for testing, engineering, manufacturing and evaluating cable. This process has allowed

us to make the vital link between scientific measurements and listening impressions.

The following precision laboratory test instruments are owned and operated in-house by KIMBER KABLE:

Yokogawa PZ4000 Power Analyzer

Klippel Analyzer System w/all modules and Laser Displacement meter

JTF Analysis System (Similar to HP 3587 except with higher 96/24 resolution)

Agilent 54624A 2 Mb Memory Mega Zoom Oscilloscope

CLIO Electro-Acoustic Analyzer

HP 4194A Impedance/Gain-Phase Analyzer

HP 4284A Precision LCR Meter

HP 4395A Network/Spectrum Impedance

Analyzer

HP 87511A 500 MHz S-Parameter Test Set

HP 33120A Function/Arbitrary Waveform

Generator

HP 3458A Digital Multimeter

HP 1141A & 1142A 200 MHz Differential

Probe and Control Module

HP 4338B Milliohmmeter

HP 54616C 500 MHz Color Oscilloscope

Rhode & Schwartz Audio Analyzer

UPD-05.1030

Other in-house test systems and components include: LEAP, MLSSA, Linear X, TEF 20 Spatial Analyzer & TEF Pad, HP3325B, Tektronix 4284A Oscilloscope, Tektronix 2247A Oscilloscope/Counter Timer, Tektronix CFG280 Function Generator, Tektronix TDS3012 Color Oscilloscope, Tektronix 2201, Brüel & Kjær 4007, ACO 4012, IVIE IE-30 Audio Analyzer, Spellman SL150 High Voltage Power Supply, Audio Control Industrial SA- 3050A Third Octave RTA, S.C.V. PC 80 Phase Checker, Sencore PR 57, Sencore LC53, Leader LCR-740, Morrell MI-10, Meiji EMZ-TR Microscope.

For production testing and quality assurance we use the following basic parameters:

Rdc: (resistance) basic dc resistance.

X:(reactance) ac resistance due to the capacitance and inductance of the cable; a frequency dependent property.

Xc: capacitive reactance.

Xl: inductive reactance.

Z:(impedance) total electrical opposition due to both ac reactance and dc resistance; a frequency dependent property.

Cp:

C:ability to store energy in electrostatic fields. Cp: parallel aspect of capacitance.

Ls:

L:ability to store energy in magnetic fields. Ls: series inductance.

Gain / Phase testing:

Gain (the increase or loss of signal) and Phase test for the cables variances caused by the C, L, R and other numerous properties of the cable system.

Crosstalk testing:

Conductors were separated at the amplifier end.

These test parameters are used for production testing and in-house comparisons. Other extensive tests such as: RF broad band tests, T/R gain/phase, R/T-GAMA, R/T-THETA, S-PARAMETERS, etc. are used in research diagnostics. Our research diagnostics further includes listening evaluation. Correlations between sensory and electrical measurements are proprietary.