National Instruments 3.21E+04 - page 133

Appendix A Specifications for AT-MIO-16XE-10 and AT-AI-16XE-10
 National Instruments Corporation A-23 AT-MIO/AI E Series User Manual
Dynamic Characteristics
Settling time for full-scale step..........10 µs to ±1 LSB accuracy
Slew rate........................................... 5 V/µs
Noise................................................. 60 µVrms, DC to 1 MHz
Stability
Offset temperature coefficient........... ±50 µV/°C
Gain temperature coefficient............. ±7.5 ppm/°C
Onboard calibration reference
Level...........................................5.000 V (±0.5 mV) (actual value
stored in EEPROM)
Temperature coefficient.............. ±0.6 ppm/°C max
Long-term stability..................... ±6 ppm/
Digital I/O
Number of channels .......................... 8 input/output
Compatibility.................................... TTL/CMOS
Power-on state................................... Input (High-Z)
Data transfers.................................... Programmed I/O
Digital logic levels............ Level Min Max
Input low voltage 0 V 0.8 V
Input high voltage 2 V 5 V
Input low current — -320 µA
Input high current — 10 µA
Output low
voltage
(IOL = 24 mA) — 0.4 V
Output high
voltage
(IOH = 13 mA) 4.35 V —
1,000 h