Appendix A Specifications for AT-MIO-16XE-50
National Instruments Corporation A-29 AT-MIO/AI E Series User Manual
Offset error
After calibration..........................±0.5 mV max
Before calibration....................... ±85 mV max
Gain error (relative to calibration reference)
After calibration..........................±0.01% of output max
Before calibration....................... ±1% of output max
Voltage Output
Range................................................ ±10 V
Output coupling.................................DC
Output impedance............................. 0.1 Ω max
Current drive..................................... ±5 mA
Protection ......................................... Short-circuit to ground
Power-on state................................... 0 V (± 85 mV)
Dynamic Characteristics
Settling time for full-scale step..........50 µs to ±0.5 LSB accuracy
Slew rate........................................... 2 V/µs
Noise................................................. 40 µVrms, DC to 1 MHz
Glitch energy (at midscale transition)
Magnitude...................................±30 mV
Duration......................................10 µs
Stability
Offset temperature coefficient........... ±25 µV/°C
Gain temperature coefficient............. ±15 ppm/°C
Onboard calibration reference
Level...........................................5.000 V (±2 mV) (actual value
stored in EEPROM)
Temperature coefficient.............. ±2 ppm/°C max
Long-term stability..................... ±15 ppm/ 1,000 h