4-5. SELECTING THE TEST MODE

There are 25 types of test modes as shown below. The groups can be switched by rotating the AMS knob. After selecting the group to be used, press the YES button. After setting a certain group, rotating the AMS knob switches between these modes.

Refer to “Group” in the table for details selected.

All adjustments and checks during servicing can be performed in the test mode in the Service group.

NOTE: Do not use the test mode in the [Develop] group. If used, the unit may not operate normally.

If the [Develop] group is set accidentally, press the MENU/NO button immediately to exit the [Develop] group.

Display

No.

Details

Mark

Group

Service

 

 

 

Check

AUTO CHECK

C01

Automatic self-diagnosis

 

 

Err Display

C02

Error history display, clear

 

 

TEMP ADJUS

C03

Temperature compensation offset adjustment

 

 

LDPWR ADJUS

C04

Laser power adjustment

 

 

Iop Write

C05

Iop data writing

 

 

Iop NV Save

C06

Writes current Iop value in read nonvolatile memory using microprocessor

 

 

EF MO ADJUS

C07

Traverse (MO) adjustment

 

 

EF CD ADJUS

C08

Traverse (CD) adjustment

 

 

FBIAS ADJUS

C09

Focus bias adjustment

 

 

AG Set (MO)

C10

Focus, tracking gain adjustment (MO)

 

 

AG Set (CD)

C11

Focus, tracking gain adjustment (CD)

 

 

TEMP CHECK

C12

Temperature compensation offset check

 

 

LDPWR CHECK

C13

Laser power check

 

 

EF MO CHECK

C14

Traverse (MO) check

 

 

EF CD CHECK

C15

Traverse (CD) check

 

 

FBIAS CHECK

C16

Focus bias check

 

 

ScurveCHECK

C17

S-curve check

 

 

VERIFYMODE

C18

Nonvolatile memory check

 

 

DETRK CHECK

C19

Detrack check

 

 

0920 CHECK

C25

Most circumference check

 

 

Iop Read

C26

Iop data display

 

 

Iop Compare

C27

Comparison with initial Iop value written in nonvolatile memory

 

 

ADJ CLEAR

C28

Initialization of nonvolatile memory for adjustment values

 

 

INFORMATION

C31

Display of microprocessor version, etc.

 

 

CPLAY1MODE

C34

Continuous playback mode

 

 

CREC 1MODE

C35

Continuous recording mode

 

 

For details of each adjustment mode, refer to “5. Electrical Adjustments”. For details of “Err Display”, refer to “Self-Diagnosis Function” on page 2.

If a different mode has been selected by mistake, press the MENU/NO button to exit that mode.

Modes with (X) in the Mark column are not used for servicing and therefore are not described in detail. If these modes are set acciden- tally, press the MENU/NO button to exit the mode immediately.

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Sony NEW, MDM-7A, KMS-2608/J1N specifications Selecting the Test Mode, Display Details Mark Group

KMS-2608/J1N, MDM-7A, NEW specifications

Sony has long been a leader in the realm of electronic innovation, and the introduction of the NEW MDM-7A and KMS-2608/J1N models further solidifies this position. These devices are a testament to Sony's commitment to delivering cutting-edge technology that enhances user experience across various applications.

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