Toshiba L517, L515 manual CASLineTest, Incremental/DecrementTest, Subtest04 ExtendedPattern

3.6￿Memory￿Test￿ 3￿￿Diagnostic￿Programs￿

test￿coverage￿would￿be￿based￿on￿the￿setting￿and￿the￿value￿in￿‘Percent￿(%)￿ mentioned￿at￿below.￿

Pattern￿Size:￿Choose￿the￿pattern￿size￿–￿BYTE,￿WORD,￿DWORD￿or￿ALL.￿

Percent￿(%):￿Choose￿the￿percentage￿of￿the￿defined￿range￿of￿the￿memory￿to￿ be￿tested.￿

Time￿Limit(h):￿Choose￿or￿Input￿the￿time￿(hour)￿of￿the￿defined￿range￿of￿the￿ memory￿to￿be￿tested.￿

Time￿Limit(m):￿Choose￿or￿Input￿the￿time￿(minute)￿of￿the￿defined￿range￿of￿ the￿memory￿to￿be￿tested.￿

1.￿ Bit￿Stuck￿High￿Test￿

Data￿pattern:￿Every￿bit￿is￿‘1’￿(Each￿bit￿is￿high)￿

2.￿ Bit￿Stuck￿Low￿Test￿

Data￿pattern:￿Every￿bit￿is￿‘0'(Each￿bit￿is￿low);￿

3.￿ Checker￿Board￿Test￿

Data￿pattern:￿Lo-byte￿and￿hi-byte￿are￿composed￿with￿0101(0x5)￿and￿1010￿(0xA);￿

4.￿ CAS￿Line￿Test￿

Data￿pattern:￿Lo-byte￿and￿hi-byte￿are￿composed￿with￿0000￿(0x0)￿and￿1111(0xF);￿

5.￿ Incremental￿Test￿

Data￿pattern:￿A￿series￿of￿increasing￿data￿from￿0￿by￿adding￿1￿each￿time;￿

6.￿ Decrement￿Test￿

Data￿Pattern:￿A￿series￿of￿decreasing￿data￿from￿the￿maximum￿(e.g.￿0xFFFF)￿by￿ subtracting￿1￿each￿time;￿

7.￿ Incremental￿/￿Decrement￿Test￿

Data￿Pattern￿is￿a￿series￿of￿data￿whose￿low￿byte￿is￿increasing￿data￿from￿0x00￿ and￿high￿byte￿is￿decreasing￿data￿from￿0xFF.￿

Subtest￿04￿ ￿Extended￿Pattern￿

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