Toshiba L517, L515 manual Subtest05Walking1’sTest, Subtest06Walking0’sTest, Subtest07MemoryAddress

3.6￿Memory￿Test￿ 3￿￿Diagnostic￿Programs￿

Test￿by￿using￿read￿instructions.￿

Subtest￿05￿￿Walking￿1’s￿Test￿

The￿test￿item￿is￿to￿ensure￿that￿there￿is￿no￿short￿circuitry￿issue￿in￿memory￿chip.￿The￿ parameter￿dialog￿window￿is￿the￿same￿as￿that￿in￿‘Subtest￿02￿Pattern’.￿

Subtest￿06￿￿Walking￿0’s￿Test￿

The￿test￿item￿is￿to￿ensure￿that￿there￿is￿no￿open￿circuitry￿issue￿in￿memory￿chip.￿The￿ parameter￿dialog￿window￿is￿the￿same￿as￿that￿in￿‘Subtest￿02￿Pattern’.￿

Subtest￿07￿￿Memory￿Address￿

This￿test￿item￿is￿to￿check￿short￿and￿open￿issue￿on￿memory￿address￿lines.￿

Subtest￿08￿￿Refresh￿Test￿

This￿test￿item￿is￿to￿check￿whether￿the￿memory￿refresh￿works￿normally.￿The￿ parameter￿dialog￿window￿is￿as￿follows:￿

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Subtest￿09￿￿Cache￿Memory￿

The￿test￿item￿is￿to￿check￿whether￿the￿CPU￿internal￿cache￿memory￿could￿be￿ accessed￿correctly.￿

Subtest￿10￿￿Random￿Memory￿

Random￿Memory￿test￿includes￿the￿following￿two￿test￿items:￿Randomize￿Test￿and￿ Random￿Incremental￿Read/Write￿Test.￿The￿parameter￿dialog￿window￿is￿the￿same￿ as￿that￿in￿‘Subtest￿03￿Extended￿Pattern’.￿

1.￿ Randomize￿Test￿

This￿test￿item￿is￿to￿check￿whether￿the￿memory￿could￿be￿correctly￿accessed￿ with￿randomized￿data￿and￿randomized￿memory￿address.￿

2.￿ Random￿Increment￿Read/Write￿

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