Seagate ST973451SS manual Short test Function Code 001b, Extended test Function Code 010b, Abort

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These testing options are described in the following two subsections.

Each test consists of three segments: an electrical test segment, a servo test segment, and a read/verify scan segment.

Short test (Function Code: 001b)

The purpose of the short test is to provide a time-limited test that tests as much of the drive as possible within 120 seconds. The short test does not scan the entire media surface, but does some fundamental tests and scans portions of the media. A complete read/verify scan is not performed and only factual failures will report a fault condition. This option provides a quick confidence test of the drive.

Extended test (Function Code: 010b)

The objective of the extended test option is to empirically test critical drive components. For example, the seek tests and on-track operations test the positioning mechanism. The read operation tests the read head element and the media surface. The write element is tested through read/write/read operations. The integrity of the media is checked through a read/verify scan of the media. Motor functionality is tested by default as a part of these tests.

The anticipated length of the Extended test is reported through the Control Mode page.

5.2.6.2.4Log page entries

When the drive begins DST, it creates a new entry in the Self-test Results Log page. The new entry is created by inserting a new self-test parameter block at the beginning of the self-test results log parameter section of the log page. Existing data will be moved to make room for the new parameter block. The drive reports 20 param- eter blocks in the log page. If there are more than 20 parameter blocks, the least recent parameter block will be deleted. The new parameter block will be initialized as follows:

1.The Function Code field is set to the same value as sent in the DST command

2.The Self-Test Results Value field is set to Fh

3.The drive will store the log page to non-volatile memory

After a self-test is complete or has been aborted, the drive updates the Self-Test Results Value field in its Self- Test Results Log page in non-volatile memory. The host may use Log Sense to read the results from up to the last 20 self-tests performed by the drive. The self-test results value is a 4-bit field that reports the results of the test. If the field is set to zero, the drive passed with no errors detected by the DST. If the field is not set to zero, the test failed for the reason reported in the field.

The drive will report the failure condition and LBA (if applicable) in the Self-test Results Log parameter. The Sense key, ASC, ASCQ, and FRU are used to report the failure condition.

5.2.6.2.5Abort

There are several ways to abort a diagnostic. You can use a SCSI Bus Reset or a Bus Device Reset message to abort the diagnostic.

You can abort a DST executing in background mode by using the abort code in the DST Function Code field. This will cause a 01 (self-test aborted by the application client) code to appear in the self-test results values log. All other abort mechanisms will be reported as a 02 (self-test routine was interrupted by a reset condition).

5.2.7Product warranty

Beginning on the date of shipment to the customer and continuing for the period specified in your purchase contract, Seagate warrants that each product (including components and subassemblies) that fails to function properly under normal use due to defect in materials or workmanship or due to nonconformance to the applica- ble specifications will be repaired or replaced, at Seagate’s option and at no charge to the customer, if returned by customer at customer’s expense to Seagate’s designated facility in accordance with Seagate’s warranty

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Savvio 15K SAS Product Manual, Rev. B

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Contents Savvio 15K SAS 100407739 Rev. BPage Revision status summary sheet Savvio 15K SAS Product Manual, Rev. B Contents Defect and error management InstallationSeagate Technology support services Interface requirementsList of Figures Page Scope Savvio 15K SAS Product Manual, Rev. B Applicable standards and reference documentation StandardsElectromagnetic compatibility Electromagnetic susceptibilityElectromagnetic compliance Electromagnetic compliance for the European UnionAustralian C-Tick Korean MICReference documents European Union Restriction of Hazardous Substances RoHSSavvio 15K SAS Product Manual, Rev. B General description Media description Standard featuresPerformance Factory-installed accessories ReliabilityFormatted capacities Programmable drive capacityOptions Performance characteristics Internal drive characteristicsSeek performance characteristics Access time Gen 2.0 LP dataFormat command execution time General performance characteristicsPrefetch/multi-segmented cache control Start/stop timeCache operation Caching write data Prefetch operationReliability specifications Error ratesRecoverable Errors Unrecoverable ErrorsReliability and service Seek errorsInterface errors Preventive maintenance4 S.M.A.R.T Controlling S.M.A.R.TPerformance impact Reporting controlTemperature Log Page 0Dh Predictive failuresThermal monitor Parameter Code DescriptionState of the drive prior to testing DST failure definitionImplementation Invoking DSTProduct warranty Short test Function Code 001bExtended test Function Code 010b Log page entriesShipping Product repair and return informationSavvio 15K SAS Product Manual, Rev. B Physical/electrical specifications AC power requirementsDC power requirements ST973451SS DC power requirementsST936751SS DC power requirements General DC power requirement notesConducted noise immunity Power sequencingCurrent profiles Typical ST936751SS current profile ST973451SS in 3 Gbit operation Power dissipationST973451SS in 1.5 Gbit operation ST936751SS in 3 Gbit operation ST936751SS in 1.5 Gbit operationEnvironmental limits TemperatureRelative humidity Shock and vibration Effective altitude sea levelShock Recommended mounting Vibration Air cleanlinessCorrosive environment Acoustics Mechanical specifications Mounting configuration dimensionsDrive internal defects/errors Defect and error managementDrive error recovery procedures SAS system errors Media Pre-Scan Background Media ScanDeferred Auto-Reallocation Idle Read After Write Installation Drive orientationCooling Air flowDrive mounting GroundingSavvio 15K SAS Product Manual, Rev. B SAS features Interface requirementsDual port support Scsi commands supported Commands supported by Savvio SAS family driveCommands supported by Savvio SAS family drive Commands supported by Savvio SAS family drive Commands supported by Savvio SAS family drive Inquiry data Mode Sense dataSavvio inquiry data Page Mode Data Header 04 45 dc cc 00 00 02 Miscellaneous features Miscellaneous operating features and conditionsMiscellaneous status SAS physical interface Datum B Section C C Section a a Physical characteristics Connector requirementsElectrical description Pin descriptionsSAS pin descriptions SAS transmitters and receiversSignal characteristics Eye masks Eye masks overview General interface characteristicsReceive eye mask Jitter tolerance masks Z1 OPTransmitter signal characteristics Peak-toSinusoidal JitterReceiver signal characteristics Receiver jitter tolerance Maximum allowable jitterCompliant jitter test pattern Cjtpat Impedance specifications Impedance requirements Sheet 1Impedance requirements Sheet 2 Transmitter characteristicsElectrical TxRx connections = -5,437dB Shows the zero-length test load Receiver characteristics Savvio 15K SAS Product Manual, Rev. B Seagate Technology support services InternetPresales Support Technical SupportData Recovery Services Authorized Service Centers Warranty ServiceData Recovery Services Call Center Toll-free Direct dial Index NumericsPage SAS See also cooling